Dahoo, Pierre Richard,
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Measurement systems, quantum engineering and RBDO method Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami - 1 online resource. - Reliability of Multiphysical Systems Set ; Volume 10 . - Reliability of multiphysical systems set ; v. 10. .
Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
9781119818984 1119818982
10.1002/9781119818984 doi
Metrology.
Electronic books.
QC88
389/.1
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Measurement systems, quantum engineering and RBDO method Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami - 1 online resource. - Reliability of Multiphysical Systems Set ; Volume 10 . - Reliability of multiphysical systems set ; v. 10. .
Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
9781119818984 1119818982
10.1002/9781119818984 doi
Metrology.
Electronic books.
QC88
389/.1