Chattopadhyay, Santanu,
Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay. - First edition. - 1 online resource (138 pages) : 10 illustrations
chapter 1 VLSI Testing -- An Introduction / chapter 2 Circuit-Level Testing / chapter 3 Test-Data Compression / chapter 4 System-on-Chip Testing / chapter 5 Network-on-Chip Testing / Santanu Chattopadhyay -- Santanu Chattopadhyay -- Santanu Chattopadhyay -- Santanu Chattopadhyay -- Santanu Chattopadhyay.
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
9781351227780
10.1201/9781351227780 doi
Digital integrated circuits--Testing.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Thermal properties.
Temperature measurements.
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.
TECHNOLOGY & ENGINEERING / Electronics / Microelectronics.
TK7874.75
621.39/50287
Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay. - First edition. - 1 online resource (138 pages) : 10 illustrations
chapter 1 VLSI Testing -- An Introduction / chapter 2 Circuit-Level Testing / chapter 3 Test-Data Compression / chapter 4 System-on-Chip Testing / chapter 5 Network-on-Chip Testing / Santanu Chattopadhyay -- Santanu Chattopadhyay -- Santanu Chattopadhyay -- Santanu Chattopadhyay -- Santanu Chattopadhyay.
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
9781351227780
10.1201/9781351227780 doi
Digital integrated circuits--Testing.
Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Thermal properties.
Temperature measurements.
TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.
TECHNOLOGY & ENGINEERING / Electronics / Microelectronics.
TK7874.75
621.39/50287