Circuit Design for Reliability (Record no. 56393)
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000 -LEADER | |
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fixed length control field | 02868nam a22005175i 4500 |
001 - CONTROL NUMBER | |
control field | 978-1-4614-4078-9 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20200421112037.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 141108s2015 xxu| s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
ISBN | 9781461440789 |
-- | 978-1-4614-4078-9 |
082 04 - CLASSIFICATION NUMBER | |
Call Number | 621.3815 |
245 10 - TITLE STATEMENT | |
Title | Circuit Design for Reliability |
300 ## - PHYSICAL DESCRIPTION | |
Number of Pages | VI, 272 p. 190 illus., 132 illus. in color. |
505 0# - FORMATTED CONTENTS NOTE | |
Remark 2 | Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs. |
520 ## - SUMMARY, ETC. | |
Summary, etc | This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management. Provides comprehensive review on various reliability mechanisms at sub-45nm nodes; Describes practical modeling and characterization techniques for reliability; Includes thorough presentation of robust design techniques for major VLSI design units; Promotes physical understanding with first-principle simulations. |
700 1# - AUTHOR 2 | |
Author 2 | Reis, Ricardo. |
700 1# - AUTHOR 2 | |
Author 2 | Cao, Yu. |
700 1# - AUTHOR 2 | |
Author 2 | Wirth, Gilson. |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | http://dx.doi.org/10.1007/978-1-4614-4078-9 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | eBooks |
264 #1 - | |
-- | New York, NY : |
-- | Springer New York : |
-- | Imprint: Springer, |
-- | 2015. |
336 ## - | |
-- | text |
-- | txt |
-- | rdacontent |
337 ## - | |
-- | computer |
-- | c |
-- | rdamedia |
338 ## - | |
-- | online resource |
-- | cr |
-- | rdacarrier |
347 ## - | |
-- | text file |
-- | |
-- | rda |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Engineering. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Computer-aided engineering. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Quality control. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Reliability. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Industrial safety. |
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Electronic circuits. |
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Engineering. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Circuits and Systems. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Quality Control, Reliability, Safety and Risk. |
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
-- | Computer-Aided Engineering (CAD, CAE) and Design. |
912 ## - | |
-- | ZDB-2-ENG |
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