Digital systems testing and testable design / (Record no. 73947)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 04858nam a2201189 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5266057 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220712205703.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 100317t20151990nyua ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780470544389 |
| -- | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | electronic |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.381/5 |
| 100 1# - AUTHOR NAME | |
| Author | Abramovici, Miron, |
| 245 10 - TITLE STATEMENT | |
| Title | Digital systems testing and testable design / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 PDF (xxi, 653 pages) : |
| 490 1# - SERIES STATEMENT | |
| Series statement | Electrical engineering, communications, and signal processing |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Preface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| Subject | Digital integrated circuits |
| General subdivision | Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| Subject | Digital integrated circuits |
| General subdivision | Design and construction. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Breuer, Melvin A. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Friedman, Arthur D. |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | New York, NY : |
| -- | Computer Science Press, |
| -- | c1990. |
| 264 #2 - | |
| -- | [Piscataqay, New Jersey] : |
| -- | IEEE Xplore, |
| -- | [1994] |
| 336 ## - | |
| -- | text |
| -- | rdacontent |
| 337 ## - | |
| -- | electronic |
| -- | isbdmedia |
| 338 ## - | |
| -- | online resource |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on PDF viewed 12/21/2015. |
| 695 ## - | |
| -- | Data models |
| 695 ## - | |
| -- | Data structures |
| 695 ## - | |
| -- | Decoding |
| 695 ## - | |
| -- | Design for testability |
| 695 ## - | |
| -- | Dictionaries |
| 695 ## - | |
| -- | Digital systems |
| 695 ## - | |
| -- | Discrete Fourier transforms |
| 695 ## - | |
| -- | Electrical fault detection |
| 695 ## - | |
| -- | Environmental factors |
| 695 ## - | |
| -- | Equations |
| 695 ## - | |
| -- | Error correction codes |
| 695 ## - | |
| -- | Fabrication |
| 695 ## - | |
| -- | Fault detection |
| 695 ## - | |
| -- | Fault diagnosis |
| 695 ## - | |
| -- | Feedback loop |
| 695 ## - | |
| -- | Generators |
| 695 ## - | |
| -- | Gold |
| 695 ## - | |
| -- | Hardware |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Integrated circuit interconnections |
| 695 ## - | |
| -- | Integrated circuit modeling |
| 695 ## - | |
| -- | Integrated circuits |
| 695 ## - | |
| -- | Logic functions |
| 695 ## - | |
| -- | Logic gates |
| 695 ## - | |
| -- | Maintenance engineering |
| 695 ## - | |
| -- | Microprocessors |
| 695 ## - | |
| -- | Object oriented modeling |
| 695 ## - | |
| -- | Observability |
| 695 ## - | |
| -- | Oscillators |
| 695 ## - | |
| -- | Parity check codes |
| 695 ## - | |
| -- | Programmable logic arrays |
| 695 ## - | |
| -- | Prototypes |
| 695 ## - | |
| -- | Radiation detectors |
| 695 ## - | |
| -- | Redundancy |
| 695 ## - | |
| -- | Registers |
| 695 ## - | |
| -- | Sequential circuits |
| 695 ## - | |
| -- | Sequential diagnosis |
| 695 ## - | |
| -- | Software |
| 695 ## - | |
| -- | Sufficient conditions |
| 695 ## - | |
| -- | Synchronization |
| 695 ## - | |
| -- | Target tracking |
| 695 ## - | |
| -- | Testing |
| 695 ## - | |
| -- | Timing |
| 695 ## - | |
| -- | Algorithm design and analysis |
| 695 ## - | |
| -- | Analytical models |
| 695 ## - | |
| -- | Books |
| 695 ## - | |
| -- | Boolean functions |
| 695 ## - | |
| -- | Built-in self-test |
| 695 ## - | |
| -- | Circuit faults |
| 695 ## - | |
| -- | Circuit synthesis |
| 695 ## - | |
| -- | Combinational circuits |
| 695 ## - | |
| -- | Complexity theory |
| 695 ## - | |
| -- | Computational modeling |
| 695 ## - | |
| -- | Controllability |
No items available.