Central Library

Single event effects in aerospace / (Record no. 74194)

000 -LEADER
fixed length control field 06412nam a2201357 i 4500
001 - CONTROL NUMBER
control field 6047596
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220712205816.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 151221s2012 njua ob 001 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781118084328
-- ebook
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
-- epub
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
-- PDF
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
-- hardback
082 00 - CLASSIFICATION NUMBER
Call Number 629.1
100 1# - AUTHOR NAME
Author Petersen, Edward,
245 10 - TITLE STATEMENT
Title Single event effects in aerospace /
300 ## - PHYSICAL DESCRIPTION
Number of Pages 1 PDF (xiii, 502 pages) :
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction -- Foundations of Single Event Analysis and Prediction -- Optimizing Heavy Ion Experiments for Analysis -- Optimizing Proton Testing -- Data Qualification and Interpretation -- Analysis of Various Types of SEU Data -- Cosmic Ray Single Event Rate Calculations -- Proton Single Event Rate Calculations -- Neutron Induced Upset -- Upsets Produced by Heavy Ion Nuclear Reactions -- Samples of Heavy Ion Rate Prediction -- Samples of Proton Rate Predictions -- Combined Environments -- Samples of Solar Events and Extreme Situations -- Upset Rates in Neutral Particle Beam (NPB) Environments -- Predictions and Observations of SEU Rates in space -- Limitations of the IRPP Approach --
520 ## - SUMMARY, ETC.
Summary, etc Enables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:. Design of heavy ion and proton experiments to optimize the data needed for single event predictions. Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity. Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions. Results of experiments that have tested space predictionsSingle Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
Subject Electromagnetic pulse.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
Subject Electronic apparatus and appliances
General subdivision Effect of radiation on.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
Subject Astrionics
General subdivision Protection.
856 42 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6047596
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Piscataway, New Jersey :
-- IEEE Press,
-- c2011.
264 #2 -
-- [Piscataqay, New Jersey] :
-- IEEE Xplore,
-- [2012]
336 ## -
-- text
-- rdacontent
337 ## -
-- electronic
-- isbdmedia
338 ## -
-- online resource
-- rdacarrier
588 ## -
-- Description based on PDF viewed 12/21/2015.
695 ## -
-- Aerospace electronics
695 ## -
-- Aerospace engineering
695 ## -
-- Alpha particles
695 ## -
-- Analytical models
695 ## -
-- Approximation methods
695 ## -
-- Atmospheric measurements
695 ## -
-- Atmospheric modeling
695 ## -
-- Belts
695 ## -
-- CMOS integrated circuits
695 ## -
-- Computers
695 ## -
-- Correlation
695 ## -
-- Cosmic rays
695 ## -
-- Diffusion processes
695 ## -
-- Dosimetry
695 ## -
-- Earth
695 ## -
-- Energy loss
695 ## -
-- Equations
695 ## -
-- Erbium
695 ## -
-- Error analysis
695 ## -
-- Exponential distribution
695 ## -
-- Extraterrestrial measurements
695 ## -
-- Fault tolerance
695 ## -
-- Fault tolerant systems
695 ## -
-- Field programmable gate arrays
695 ## -
-- Force
695 ## -
-- Gaussian distribution
695 ## -
-- Geometry
695 ## -
-- Helium
695 ## -
-- Indexes
695 ## -
-- Instruments
695 ## -
-- Integrated circuit modeling
695 ## -
-- Ionization
695 ## -
-- Iron
695 ## -
-- Junctions
695 ## -
-- Lead
695 ## -
-- Limiting
695 ## -
-- Low earth orbit satellites
695 ## -
-- MOS devices
695 ## -
-- Mathematical model
695 ## -
-- Measurement uncertainty
695 ## -
-- Monitoring
695 ## -
-- Monte Carlo methods
695 ## -
-- NASA
695 ## -
-- Neutrons
695 ## -
-- Orbits
695 ## -
-- Particle beam measurements
695 ## -
-- Particle beams
695 ## -
-- Power capacitors
695 ## -
-- Probability
695 ## -
-- Protons
695 ## -
-- Radiation detectors
695 ## -
-- Radiation effects
695 ## -
-- Random access memory
695 ## -
-- Scattering
695 ## -
-- Sections
695 ## -
-- Semiconductor device measurement
695 ## -
-- Semiconductor device modeling
695 ## -
-- Sensitivity
695 ## -
-- Shape
695 ## -
-- Silicon
695 ## -
-- Single event upset
695 ## -
-- Solids
695 ## -
-- Space missions
695 ## -
-- Space vehicles
695 ## -
-- Systematics
695 ## -
-- Testing
695 ## -
-- Transient analysis
695 ## -
-- Tungsten
695 ## -
-- Weapons

No items available.