Neutron and x-ray reflectometry : (Record no. 82966)

000 -LEADER
fixed length control field 04994nam a2200673 i 4500
001 - CONTROL NUMBER
control field 9780750346955
003 - CONTROL NUMBER IDENTIFIER
control field IOP
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230516170339.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m eo d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cn |||m|||a
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230109s2022 enka fob 000 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780750346955
Qualifying information ebook
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780750346948
Qualifying information mobi
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780750346931
Qualifying information print
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780750346962
Qualifying information myPrint
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1088/978-0-7503-4695-5
Source of number or code doi
035 ## - SYSTEM CONTROL NUMBER
System control number (CaBNVSL)thg00083544
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)1358413980
040 ## - CATALOGING SOURCE
Original cataloging agency CaBNVSL
Language of cataloging eng
Description conventions rda
Transcribing agency CaBNVSL
Modifying agency CaBNVSL
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC378
Item number .B376 2022eb
072 #7 - SUBJECT CATEGORY CODE
Subject category code PHM
Source bicssc
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI038000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.36028/4
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Basu, Saibal,
Relator term author.
9 (RLIN) 71151
245 10 - TITLE STATEMENT
Title Neutron and x-ray reflectometry :
Remainder of title emerging phenomena at heterostructure interfaces /
Statement of responsibility, etc. Saibal Basu, Surendra Singh.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) :
Name of producer, publisher, distributor, manufacturer IOP Publishing,
Date of production, publication, distribution, manufacture, or copyright notice [2022]
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (various pagings) :
Other physical details illustrations (some color).
336 ## - CONTENT TYPE
Content type term text
Source rdacontent
337 ## - MEDIA TYPE
Media type term electronic
Source isbdmedia
338 ## - CARRIER TYPE
Carrier type term online resource
Source rdacarrier
490 1# - SERIES STATEMENT
Series statement [IOP release $release]
490 1# - SERIES STATEMENT
Series statement IOP ebooks. [2022 collection]
500 ## - GENERAL NOTE
General note "Version: 20221201"--Title page verso.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note 1. Introduction -- 1.1. Interface-driven properties using neutron/x-ray reflectometry -- 1.2. Emerging phenomena at interfaces using polarized neutron reflectometry -- 1.3. Thin-film growth mechanisms -- 1.4. Thin-film deposition techniques -- 1.5. Other complementary surface characterisation techniques
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 2. Theory of neutron reflectometry -- 2.1. Introduction -- 2.2. Optical theory of reflection -- 2.3. Specular NR using unpolarized neutrons -- 2.4. Specular polarized neutron reflectometry -- 2.5. Coherence area and resolution in neutron reflectometry experiments -- 2.6. Off-specular (or diffuse) neutron scattering -- 2.7. Polarized diffuse neutron scattering -- 2.8. Data analysis for reflectometry
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 3. Understanding emerging phenomena at interfaces using specular neutron and x-ray reflectometry -- 3.1. Emerging phenomena at interfaces and characterization -- 3.2. Ferromagnetic metal/semiconductor heterostructures -- 3.3. Interlayer exchange coupling : ferromagnetic metal/nonmagnetic metal heterostructures -- 3.4. Multilayer with noncolinear and chiral magnetic structures -- 3.5. Exchange bias : interface magnetization -- 3.6. Proximity effect and coupling in complex oxide magnetic and superconducting heterostructures -- 3.7. Strain-driven interfacial magnetism in complex oxide heterostructures -- 3.8. Emergent and interface-induced magnetism at complex oxide interfaces -- 3.9. Superdense and nonmagnetic Co phase at interfaces -- 3.10. Tracking interdiffusion and self-diffusion kinetics at interfaces -- 3.11. Proximity-driven magnetic order in topological insulators and interface magnetization in Weyl semimetal -- 3.12. Control of local magnetization in isovalent oxide heterostructures by interface engineering
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 4. Correlation of interface morphology and magnetism in heterostructures : off-specular (diffuse) scattering -- 4.1. Off-specular (diffuse) scattering -- 4.2. Off-specular (diffuse) x-ray scattering -- 4.3. Off-specular (diffuse) neutron scattering -- 5. Summary and outlook.
520 3# - SUMMARY, ETC.
Summary, etc. This book presents x-ray and neutron reflectometry techniques and how they can be used to explore interface structure and magnetism at mesoscopic length scale in thin films and multilayers.
521 ## - TARGET AUDIENCE NOTE
Target audience note Research students and institutions that are carrying out work in thin film structure and magnetism.
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE
Additional physical form available note Also available in print.
538 ## - SYSTEM DETAILS NOTE
System details note Mode of access: World Wide Web.
538 ## - SYSTEM DETAILS NOTE
System details note System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
545 ## - BIOGRAPHICAL OR HISTORICAL DATA
Biographical or historical data Saibal Basu carried out research in the field of neutron scattering and neutron instrumentation at Dhruva reactor in India for more than three decades. Surendra Singh is a scientist at the Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai.
588 0# - SOURCE OF DESCRIPTION NOTE
Source of description note Title from PDF title page (viewed on January 9, 2023).
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Thin films
General subdivision Optical properties.
9 (RLIN) 71152
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Neutrons
General subdivision Scattering.
9 (RLIN) 68265
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element X-rays
General subdivision Scattering.
9 (RLIN) 68370
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Reflection (Optics)
9 (RLIN) 71153
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Atomic & molecular physics.
Source of heading or term bicssc
9 (RLIN) 70165
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element SCIENCE / Physics / Magnetism.
Source of heading or term bisacsh
9 (RLIN) 6912
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Singh, Surendra
Titles and other words associated with a name (Ph. D. in physics),
Relator term author.
9 (RLIN) 71154
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element Institute of Physics (Great Britain),
Relator term publisher.
9 (RLIN) 11622
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
International Standard Book Number 9780750346931
-- 9780750346962
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title IOP (Series).
Name of part/section of a work Release 22.
9 (RLIN) 71155
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title IOP ebooks.
Name of part/section of a work 2022 collection.
9 (RLIN) 71156
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://iopscience.iop.org/book/mono/978-0-7503-4695-5">https://iopscience.iop.org/book/mono/978-0-7503-4695-5</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks

No items available.