An Introduction to Logic Circuit Testing (Record no. 85373)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 03266nam a22005535i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 978-3-031-79785-9 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20240730164154.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 220601s2009 sz | s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9783031797859 |
| -- | 978-3-031-79785-9 |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 620 |
| 100 1# - AUTHOR NAME | |
| Author | Lala, Parag K. |
| 245 13 - TITLE STATEMENT | |
| Title | An Introduction to Logic Circuit Testing |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 1st ed. 2009. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | X, 99 p. |
| 490 1# - SERIES STATEMENT | |
| Series statement | Synthesis Lectures on Digital Circuits & Systems, |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Introduction -- Fault Detection in Logic Circuits -- Design for Testability -- Built-in Self-Test -- References. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://doi.org/10.1007/978-3-031-79785-9 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Cham : |
| -- | Springer International Publishing : |
| -- | Imprint: Springer, |
| -- | 2009. |
| 336 ## - | |
| -- | text |
| -- | txt |
| -- | rdacontent |
| 337 ## - | |
| -- | computer |
| -- | c |
| -- | rdamedia |
| 338 ## - | |
| -- | online resource |
| -- | cr |
| -- | rdacarrier |
| 347 ## - | |
| -- | text file |
| -- | |
| -- | rda |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Engineering. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic circuits. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Control engineering. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Robotics. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Automation. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Computers. |
| 650 14 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Technology and Engineering. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Electronic Circuits and Systems. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Control, Robotics, Automation. |
| 650 24 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Computer Hardware. |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| -- | 1932-3174 |
| 912 ## - | |
| -- | ZDB-2-SXSC |
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