LSI/VLSI TESTABILITY DESIGN
By: TSUI,F.F.
Material type:
BookPublisher: NEW YORK McGraw-Hill 1987Description: 22X15.ISBN: 0070653410.DDC classification: 621.38175 T877
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
|
CENTRAL LIBRARY | 621.38175 T877 (Browse shelf) | Available | 052131 | |
|
Books
|
CENTRAL LIBRARY | 621.38175 T877 (Browse shelf) | Available | 052949 |
Browsing CENTRAL LIBRARY Shelves Close shelf browser
| No cover image available | No cover image available |
|
|
No cover image available |
|
|
||
| 621.38175 T7688 EXPERIMENTER'S GUIDE TO INTEGRATED CIRCUITS | 621.38175 T7688 EXPERIMENTER'S GUIDE TO INTEGRATED CIRCUITS | 621.38175 T877 LSI/VLSI TESTABILITY DESIGN | 621.38175 T877 LSI/VLSI TESTABILITY DESIGN | 621.38175 U973 FUNDAMENTALS OF MOS DIGITAL INTEGRATED CIRCUITS | 621.38175 U973 CMOS LOGIC CIRCUIT DESIGN | 621.38175 V128 VLSI DESIGN |
There are no comments for this item.