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Single event effects in aerospace / Edward Petersen.

By: Petersen, Edward, 1932-.
Contributor(s): IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.].
Material type: materialTypeLabelBookPublisher: Piscataway, New Jersey : IEEE Press, c2011Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012]Description: 1 PDF (xiii, 502 pages) : illustrations.Content type: text Media type: electronic Carrier type: online resourceISBN: 9781118084328.Subject(s): Electromagnetic pulse | Electronic apparatus and appliances -- Effect of radiation on | Astrionics -- Protection | Aerospace electronics | Aerospace engineering | Alpha particles | Analytical models | Approximation methods | Atmospheric measurements | Atmospheric modeling | Belts | CMOS integrated circuits | Computers | Correlation | Cosmic rays | Diffusion processes | Dosimetry | Earth | Energy loss | Equations | Erbium | Error analysis | Exponential distribution | Extraterrestrial measurements | Fault tolerance | Fault tolerant systems | Field programmable gate arrays | Force | Gaussian distribution | Geometry | Helium | Indexes | Instruments | Integrated circuit modeling | Ionization | Iron | Junctions | Lead | Limiting | Low earth orbit satellites | MOS devices | Mathematical model | Measurement uncertainty | Monitoring | Monte Carlo methods | NASA | Neutrons | Orbits | Particle beam measurements | Particle beams | Power capacitors | Probability | Protons | Radiation detectors | Radiation effects | Random access memory | Scattering | Sections | Semiconductor device measurement | Semiconductor device modeling | Sensitivity | Shape | Silicon | Single event upset | Solids | Space missions | Space vehicles | Systematics | Testing | Transient analysis | Tungsten | WeaponsGenre/Form: Electronic books.Additional physical formats: Print version:: No titleDDC classification: 629.1 Online resources: Abstract with links to resource Also available in print.
Contents:
Introduction -- Foundations of Single Event Analysis and Prediction -- Optimizing Heavy Ion Experiments for Analysis -- Optimizing Proton Testing -- Data Qualification and Interpretation -- Analysis of Various Types of SEU Data -- Cosmic Ray Single Event Rate Calculations -- Proton Single Event Rate Calculations -- Neutron Induced Upset -- Upsets Produced by Heavy Ion Nuclear Reactions -- Samples of Heavy Ion Rate Prediction -- Samples of Proton Rate Predictions -- Combined Environments -- Samples of Solar Events and Extreme Situations -- Upset Rates in Neutral Particle Beam (NPB) Environments -- Predictions and Observations of SEU Rates in space -- Limitations of the IRPP Approach --
Summary: Enables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:. Design of heavy ion and proton experiments to optimize the data needed for single event predictions. Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity. Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions. Results of experiments that have tested space predictionsSingle Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments.
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Includes bibliographical references (p. 455-487) and indexes.

Introduction -- Foundations of Single Event Analysis and Prediction -- Optimizing Heavy Ion Experiments for Analysis -- Optimizing Proton Testing -- Data Qualification and Interpretation -- Analysis of Various Types of SEU Data -- Cosmic Ray Single Event Rate Calculations -- Proton Single Event Rate Calculations -- Neutron Induced Upset -- Upsets Produced by Heavy Ion Nuclear Reactions -- Samples of Heavy Ion Rate Prediction -- Samples of Proton Rate Predictions -- Combined Environments -- Samples of Solar Events and Extreme Situations -- Upset Rates in Neutral Particle Beam (NPB) Environments -- Predictions and Observations of SEU Rates in space -- Limitations of the IRPP Approach --

Restricted to subscribers or individual electronic text purchasers.

Enables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:. Design of heavy ion and proton experiments to optimize the data needed for single event predictions. Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity. Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions. Results of experiments that have tested space predictionsSingle Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments.

Also available in print.

Mode of access: World Wide Web

Description based on PDF viewed 12/21/2015.

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