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VLSI Design and Test for Systems Dependability

By: Asai, Shojiro.
Publisher: Japan Springer 2019Description: p.800.ISBN: 9784431565925.Subject(s): Electromagnetic Noises | Variations in Device Characteristics | Design and Development of Electronic Systems for Quality and DependabilityDDC classification: 621.395 A80V
List(s) this item appears in: NBA July Visit
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621.395 A80V (Browse shelf) Available 105258

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