Atomic-scale analytical tomography : concepts and implications / Thomas F. Kelly, Brian P. Gorman, Simon P. Ringer.
By: Kelly, Thomas F [author.]
.
Contributor(s): Gorman, Brian P [author.] | Ringer, Simon P [author.].
Material type: 
BookSeries: Advances in microscopy and microanalysis: Publisher: Cambridge : Cambridge University Press, 2022Description: 1 online resource (xxii, 240 pages) : digital, PDF file(s).Content type: text Media type: computer Carrier type: online resourceISBN: 9781316677292 (ebook).Subject(s): Tomography | Transmission electron microscopy | Atom-probe field ion microscopyAdditional physical formats: Print version: : No titleDDC classification: 616.07572 Online resources: Click here to access online Summary: A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
Title from publisher's bibliographic system (viewed on 04 Mar 2022).
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
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