Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder.
Contributor(s): Yeung, Dit-Yan [editor.]
| Kwok, James T [editor.] | Fred, Ana [editor.] | Roli, Fabio [editor.] | de Ridder, Dick [editor.] | SpringerLink (Online service).
Material type: 
BookSeries: Image Processing, Computer Vision, Pattern Recognition, and Graphics: 4109Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006Edition: 1st ed. 2006.Description: XXI, 939 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783540372417.Subject(s): Pattern recognition systems | Computer science -- Mathematics | Discrete mathematics | Artificial intelligence | Computer graphics | Computer vision | Automated Pattern Recognition | Discrete Mathematics in Computer Science | Artificial Intelligence | Computer Graphics | Computer VisionAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 006.4 Online resources: Click here to access online
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Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.
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Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.
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