VLSI Design and Test  17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers /  [electronic resource] : 
edited by Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Sing, Adit D. Sing. 
 - XVI, 388 p. 246 illus.  online resource. 
 - Communications in Computer and Information Science,  382  1865-0929 ; .
 - Communications in Computer and Information Science,  382 .
<br/><br/>VLSI design -- Testing and verification -- Embedded systems -- Emerging technology. 
<br/><br/> This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology. 
<br/><br/><label>ISBN: </label>9783642420245 
<br/><br/><label>Standard No.: </label>10.1007/978-3-642-42024-5  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer science.<br/>Computer hardware.<br/>Microprocessors.<br/>Computer communication systems.<br/>Computer Science.<br/>Computer Hardware.<br/>Processor Architectures.<br/>Computer Communication Networks.
<br/><br/><label>LC Class. No.: </label>QA75.5-76.95 TK7885-7895 
<br/><br/><label>Dewey Class. No.: </label>004