Asai, Shojiro <br/><br/>
VLSI Design and Test for Systems Dependability 

 - Japan  Springer  2019 
 - p.800 
<br/><br/><label>ISBN: </label>9784431565925 
<br/><br/><label>Subjects--Topical Terms: </label> Electromagnetic Noises  Variations in Device Characteristics  Design and Development of Electronic Systems for Quality and Dependability 
<br/><br/><label>Dewey Class. No.: </label>621.395 A80V