Chattopadhyay, Santanu, <br/><br/>
Thermal-aware testing of digital vlsi circuits and systems / 
by Santanu Chattopadhyay. 
 - First edition. 
 - 1 online resource (138 pages) :  10 illustrations 
<br/><br/> chapter 1 VLSI Testing --   An Introduction /  chapter 2 Circuit-Level Testing /  chapter 3 Test-Data Compression /  chapter 4 System-on-Chip Testing /  chapter 5 Network-on-Chip Testing /  Santanu Chattopadhyay --   Santanu Chattopadhyay --   Santanu Chattopadhyay --   Santanu Chattopadhyay --   Santanu Chattopadhyay. 
<br/><br/> This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips. 
<br/><br/><label>ISBN: </label>9781351227780 
<br/><br/><label>Standard No.: </label>10.1201/9781351227780   doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing.<br/>Integrated circuits--Very large scale integration--Testing.<br/>Integrated circuits--Very large scale integration--Thermal properties.<br/>Temperature measurements.<br/>TECHNOLOGY & ENGINEERING / Electronics / Circuits / General.<br/>TECHNOLOGY & ENGINEERING / Electronics / Microelectronics.
<br/><br/><label>LC Class. No.: </label>TK7874.75 
<br/><br/><label>Dewey Class. No.: </label>621.39/50287