An Introduction to Logic Circuit Testing [electronic resource] /
by Parag K. Lala.
- 1st ed. 2009.
- X, 99 p. online resource.
- Synthesis Lectures on Digital Circuits & Systems, 1932-3174 .
- Synthesis Lectures on Digital Circuits & Systems, .
Introduction -- Fault Detection in Logic Circuits -- Design for Testability -- Built-in Self-Test -- References.
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References.
9783031797859
10.1007/978-3-031-79785-9 doi
Engineering. Electronic circuits. Control engineering. Robotics. Automation. Computers. Technology and Engineering. Electronic Circuits and Systems. Control, Robotics, Automation. Computer Hardware.