Central Library catalog › Results of search for 'su:"Testing"'

Your search returned 160 results.

		Analysis of pile foundations subject to static and dynamic loading. by Kaynia, A. M. (Amir M.). Material type: Book; Format: available online ; Literary form: Not fiction Publisher: [S.l.] : CRC Press, 2022Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Nanotoxicology toxicity evaluation of nanomedicine applications / edited by Hemant Kumar Daima, Shanker Lal Kothari, Bhargava Suresh Kumar. by Daima, Hemant Kumar [editor.] \| Kothari, Shanker Lal [editor.] \| Suresh Kumar, Bhargava [editor.]. Material type: Book; Format: available online ; Literary form: Not fiction ; Audience: Specialized; Publisher: Boca Raton : CRC Press, 2021Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Recent advancements in software reliability assurance / edited by Adarsh Anand, Mangey Ram. by Anand, Adarsh [author.] \| Ram, Mangey [author.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2019Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Introduction to product design and development for engineers / by Dr. Ali Jamnia. by Dr. Ali Jamnia [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
		Industrial approaches in vibration-based condition monitoring / Jyoti Sinha. by Sinha, Jyoti Kumar [author.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton : CRC Press, 2020Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Advanced textile testing techniques / [edited by] Sheraz Ahmad, Abher Rasheed, Ali Afzal and Faheem Ahmad. by Afzal, Ali (Materials scientist) [editor.] \| Ahmad, Faheem [editor.] \| Ahmad, Sheraz [editor.] \| Rasheed, Abher [editor.]. Material type: Book; Literary form: Not fiction Publisher: Boca Raton : Taylor & Francis, CRC Press, 2017Online access: Click here to view. Availability: No items available
		Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski. by Chrzanowska-Jeske, Malgorzata [editor.] \| Weide-Zaage, Kirsten [editor.]. Material type: Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Online access: Click here to view. Availability: No items available
		Food packaging materials : testing & quality assurance / edited by Preeti Singh, Ali Abas Wani, Horst-Christian Langowski. by Singh, Preeti (Materials scientist) [editor.] \| Wani, Ali Abas [editor.] \| Langowski, Horst-Christian [editor.]. Material type: Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Online access: Click here to view. Availability: No items available
		Handbook of Visual Optics, Volume Two : Instrumentation and Vision Correction. by Artal, Pablo [editor.]. Edition: First edition.Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2017Online access: Taylor & Francis Click here to view. \| OCLC metadata license agreement Availability: No items available
		Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay. by Chattopadhyay, Santanu [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
		Condition monitoring and faults diagnosis of induction motors : electrical signature analysis / by Nordin Saad, Muhammad Irfan and Rosdiazli Ibrahim. by Saad, Nordin [author.] \| Irfan, Muhammad [author.] \| Ibrahim, Rosdiazli [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available
		Inelasticity of materials [electronic resource] : an engineering approach and a practical guide / Arun R. Srinivasa, Sivakumar M. Srinivasan. by Srinivasa, Arun R. (Arun Ramaswamy) \| Sivakumar, Srinivasan M. Material type: Computer file; Format: electronic available online Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2009Online access: Access to full text is restricted to subscribers. Availability: No items available
		Compressibility of ultra-soft soil [electronic resource] / Myint Win Bo. by Bo, Myint Win, 1954-. Material type: Computer file; Format: electronic available online Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2008Online access: Access to full text is restricted to subscribers. Availability: No items available
		Logic testing and design for testability / Hideo Fujiwara. by Fujiwara, Hideo [author.] \| IEEE Xplore (Online Service) [distributor.] \| MIT Press [publisher.]. Material type: Book; Format: available online Publisher: Cambridge, Massachusetts : MIT Press, c1985Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1985]Online access: Abstract with links to resource Availability: No items available
		Automated defect prevention : best practices in software management / Dorota Huizinga, Adam Kolawa. by Huizinga, Dorota [author.] \| Kolawa, Adam \| IEEE Xplore (Online Service) [distributor.] \| Wiley InterScience (Online service) [publisher.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Hoboken, New Jersey : Wiley-Interscience : c2007Online access: Abstract with links to resource Availability: No items available
		Software testing : testing across the entire software development life cycle / Gerald D. Everett, Raymond McLeod, Jr. by Everett, Gerald D, 1943- [author.] \| McLeod, Raymond \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: [Piscataway, New Jersey] : IEEE Press, c2007Online access: Abstract with links to resource Availability: No items available
		Semiconductor material and device characterization / Dieter K. Schroder. by Schroder, Dieter K [author.] \| John Wiley & Sons [publisher.] \| IEEE Xplore (Online service) [distributor.]. Edition: 3rd ed.Material type: Book; Format: available online Publisher: [Piscataway, New Jersey] : IEEE Press, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available
		Integrated circuit manufacturability : the art of process and design integration / edited by Jos�e Pineda de Gyvez, Dhiraj Pradhan. by Pradhan, Dhiraj K \| Pineda de Gyvez, Jos�e \| John Wiley & Sons [publisher.] \| IEEE Circuits and Systems Society \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c1999Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available
		Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. by Abramovici, Miron [author.] \| Breuer, Melvin A \| Friedman, Arthur D \| John Wiley & Sons [publisher.] \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available
		Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert. by Chan, H. Anthony, 1952- \| Englert, Paul J, 1960- \| John Wiley & Sons [publisher.] \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available

		Analysis of pile foundations subject to static and dynamic loading. by Kaynia, A. M. (Amir M.). Material type: Book; Format: available online ; Literary form: Not fiction Publisher: [S.l.] : CRC Press, 2022Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Nanotoxicology toxicity evaluation of nanomedicine applications / edited by Hemant Kumar Daima, Shanker Lal Kothari, Bhargava Suresh Kumar. by Daima, Hemant Kumar [editor.] \| Kothari, Shanker Lal [editor.] \| Suresh Kumar, Bhargava [editor.]. Material type: Book; Format: available online ; Literary form: Not fiction ; Audience: Specialized; Publisher: Boca Raton : CRC Press, 2021Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Recent advancements in software reliability assurance / edited by Adarsh Anand, Mangey Ram. by Anand, Adarsh [author.] \| Ram, Mangey [author.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2019Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Introduction to product design and development for engineers / by Dr. Ali Jamnia. by Dr. Ali Jamnia [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
		Industrial approaches in vibration-based condition monitoring / Jyoti Sinha. by Sinha, Jyoti Kumar [author.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton : CRC Press, 2020Online access: Taylor & Francis \| OCLC metadata license agreement Availability: No items available
		Advanced textile testing techniques / [edited by] Sheraz Ahmad, Abher Rasheed, Ali Afzal and Faheem Ahmad. by Afzal, Ali (Materials scientist) [editor.] \| Ahmad, Faheem [editor.] \| Ahmad, Sheraz [editor.] \| Rasheed, Abher [editor.]. Material type: Book; Literary form: Not fiction Publisher: Boca Raton : Taylor & Francis, CRC Press, 2017Online access: Click here to view. Availability: No items available
		Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski. by Chrzanowska-Jeske, Malgorzata [editor.] \| Weide-Zaage, Kirsten [editor.]. Material type: Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Online access: Click here to view. Availability: No items available
		Food packaging materials : testing & quality assurance / edited by Preeti Singh, Ali Abas Wani, Horst-Christian Langowski. by Singh, Preeti (Materials scientist) [editor.] \| Wani, Ali Abas [editor.] \| Langowski, Horst-Christian [editor.]. Material type: Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Online access: Click here to view. Availability: No items available
		Handbook of Visual Optics, Volume Two : Instrumentation and Vision Correction. by Artal, Pablo [editor.]. Edition: First edition.Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, 2017Online access: Taylor & Francis Click here to view. \| OCLC metadata license agreement Availability: No items available
		Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay. by Chattopadhyay, Santanu [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
		Condition monitoring and faults diagnosis of induction motors : electrical signature analysis / by Nordin Saad, Muhammad Irfan and Rosdiazli Ibrahim. by Saad, Nordin [author.] \| Irfan, Muhammad [author.] \| Ibrahim, Rosdiazli [author.] \| Taylor and Francis. Edition: First edition.Material type: Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available
		Inelasticity of materials [electronic resource] : an engineering approach and a practical guide / Arun R. Srinivasa, Sivakumar M. Srinivasan. by Srinivasa, Arun R. (Arun Ramaswamy) \| Sivakumar, Srinivasan M. Material type: Computer file; Format: electronic available online Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2009Online access: Access to full text is restricted to subscribers. Availability: No items available
		Compressibility of ultra-soft soil [electronic resource] / Myint Win Bo. by Bo, Myint Win, 1954-. Material type: Computer file; Format: electronic available online Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2008Online access: Access to full text is restricted to subscribers. Availability: No items available
		Logic testing and design for testability / Hideo Fujiwara. by Fujiwara, Hideo [author.] \| IEEE Xplore (Online Service) [distributor.] \| MIT Press [publisher.]. Material type: Book; Format: available online Publisher: Cambridge, Massachusetts : MIT Press, c1985Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1985]Online access: Abstract with links to resource Availability: No items available
		Automated defect prevention : best practices in software management / Dorota Huizinga, Adam Kolawa. by Huizinga, Dorota [author.] \| Kolawa, Adam \| IEEE Xplore (Online Service) [distributor.] \| Wiley InterScience (Online service) [publisher.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Hoboken, New Jersey : Wiley-Interscience : c2007Online access: Abstract with links to resource Availability: No items available
		Software testing : testing across the entire software development life cycle / Gerald D. Everett, Raymond McLeod, Jr. by Everett, Gerald D, 1943- [author.] \| McLeod, Raymond \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: [Piscataway, New Jersey] : IEEE Press, c2007Online access: Abstract with links to resource Availability: No items available
		Semiconductor material and device characterization / Dieter K. Schroder. by Schroder, Dieter K [author.] \| John Wiley & Sons [publisher.] \| IEEE Xplore (Online service) [distributor.]. Edition: 3rd ed.Material type: Book; Format: available online Publisher: [Piscataway, New Jersey] : IEEE Press, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available
		Integrated circuit manufacturability : the art of process and design integration / edited by Jos�e Pineda de Gyvez, Dhiraj Pradhan. by Pradhan, Dhiraj K \| Pineda de Gyvez, Jos�e \| John Wiley & Sons [publisher.] \| IEEE Circuits and Systems Society \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c1999Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available
		Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. by Abramovici, Miron [author.] \| Breuer, Melvin A \| Friedman, Arthur D \| John Wiley & Sons [publisher.] \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available
		Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert. by Chan, H. Anthony, 1952- \| Englert, Paul J, 1960- \| John Wiley & Sons [publisher.] \| IEEE Xplore (Online service) [distributor.]. Material type: Book; Format: available online ; Literary form: Not fiction Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available

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