Neutrons and synchrotron radiation in engineering materials science : from fundamentals to applications / edited by Peter Staron, Andreas Schreyer, Helmut Clemens, and Svea Mayer.
Contributor(s): Staron, Peter [editor.] | Schreyer, Andreas [editor.] | Clemens, Helmut [editor.] | Mayer, Svea [editor.].
Material type: BookPublisher: Weinheim : Wiley-VCH, [2017]Copyright date: ©2017Edition: Second Edition.Description: 1 online resource (xxiv, 462 pages) : illustrations.Content type: text Media type: computer Carrier type: online resourceISBN: 9783527684519; 3527684514; 9783527684502; 3527684506; 9783527684496; 3527684492; 9783527684489; 3527684484.Subject(s): Synchrotron radiation | Materials -- Testing | Materials -- Analysis | Materials -- Effect of radiation on | TECHNOLOGY & ENGINEERING / Engineering (General) | TECHNOLOGY & ENGINEERING / ReferenceGenre/Form: Electronic books.DDC classification: 620.11272 Online resources: Wiley Online LibraryOnline resource; title from PDF title page (EBSCO, viewed February 1, 2017)
Includes bibliographical references and index.
General. Microstructure and Properties of Engineering Materials / Helmut Clemens, Svea Mayer, Christina Scheu -- Internal Stresses in Engineering Materials / Anke Kaysser-Pyzalla -- Textures in Engineering Materials / Heinz G Brokmeier, Sangbong Yi -- Physical Properties of Photons and Neutrons / Andreas Schreyer -- Radiation Sources / Ina Lommatzsch, Wolfgang Knop, Philipp K Pranzas, Peter Schreiner, Rolf Treusch -- Methods. Stress Analysis by Angle-Dispersive Neutron Diffraction / Peter Staron -- Stress Analysis by Energy-Dispersive Neutron Diffraction / Javier Santisteban -- Residual Stress Analysis by Monochromatic High-Energy X-rays / René V Martins -- Residual Stress Analysis by Energy-Dispersive Synchrotron X-ray Diffraction / Christoph Genzel, Manuela Klaus -- Texture Analyses by Synchrotron X-rays and Neutrons / Sangbong Yi, Weimin Gan, Heinz-G Brokmeier -- Basics of Small-Angle Scattering Methods / Philipp K Pranzas -- Small-Angle Neutron Scattering / Philipp K Pranzas, André Heinemann -- Anomalous Small-Angle X-ray Scattering / Ulla Vainio -- Imaging / Wolfgang Treimer -- Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomography / Felix Beckmann -- -Tomography of Engineering Materials / Astrid Haibel, Julia Herzen -- New and Emerging Methods. 3D X-ray Diffraction Microscope / Henning F Poulsen, Wolfgang Ludwig, Søren Schmidt -- 3D Micron-Resolution Laue Diffraction / Gene E Ice -- Applications. The Use of Neutron and Synchrotron Research for Aerospace and Automotive Materials and Components / Wolfgang Kaysser, Jörg Eßlinger, Volker Abetz, Norbert Huber, Karl U Kainer, Thomas Klassen, Florian Pyczak, Andreas Schreyer, Peter Staron -- In situ Experiments with Synchrotron High-Energy X-rays and Neutrons / Peter Staron, Torben Fischer, Thomas Lippmann, Andreas Stark, Shahrokh Daneshpour, Dirk Schnubel, Eckart Uhlmann, Robert Gerstenberger, Bettina Camin, Walter Reimers, Elisabeth Eidenberger-Schober, Helmut Clemens, Norbert Huber, Andreas Schreyer -- Application of Photons and Neutrons for the Characterization and Development of Advanced Steels / Elisabeth Eidenberger-Schober, Ronald Schnitzer, Gerald A Zickler, Michael Eidenberger-Schober, Michael Bischof, Peter Staron, Harald Leitner, Andreas Schreyer, Helmut Clemens -- The Contribution of High-Energy X-rays and Neutrons to Characterization and Development of Intermetallic Titanium Aluminides / Thomas Schmoelzer, Klaus-Dieter Liss, Peter Staron, Andreas Stark, Emanuel Schwaighofer, Thomas Lippmann, Helmut Clemens, Svea Mayer -- In situ Laue: Instrumental Setup for the Deformation of Micron Sized Samples / Christoph Kirchlechner, Jozef Keckes, Jean S Micha, Gerhard Dehm -- Residual Stresses in Thin Films and Coated Tools: Challenges and Strategies for Their Nondestructive Analysis by X-ray Diffraction Methods / Manuela Klaus, Christoph Genzel.
Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
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