Metrology and standardization of nanotechnology : protocols and industrial innovations / edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
Contributor(s): Mansfield, Elisabeth [editor.]
| Kaiser, Debra L [editor.] | Fujita, Daisuke [editor.] | Voorde, M. H. van de (Marcel H.) [editor.].
Material type: 
BookSeries: Nanotechnology innovation & applications: Publisher: Weinheim, Germany : Wiley-VCH, 2017Description: 1 online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783527800308; 3527800301; 3527800050; 9783527800056.Subject(s): Nanotechnology | Metrology | TECHNOLOGY & ENGINEERING / Engineering (General) | TECHNOLOGY & ENGINEERING / ReferenceGenre/Form: Electronic books.DDC classification: 620/.5 Online resources: Wiley Online Library
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Includes bibliographical references and index.
Online resource; title from PDF title page (John Wiley, viewed January 31, 2017).
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