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CMOS Test and Evaluation [electronic resource] : A Physical Perspective / by Manjul Bhushan, Mark B. Ketchen.

By: Bhushan, Manjul [author.].
Contributor(s): Ketchen, Mark B [author.] | SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: New York, NY : Springer New York : Imprint: Springer, 2015Description: XIII, 424 p. 338 illus. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781493913497.Subject(s): Engineering | Semiconductors | Quality control | Reliability | Industrial safety | Electronics | Microelectronics | Electronic circuits | Engineering | Electronics and Microelectronics, Instrumentation | Circuits and Systems | Semiconductors | Quality Control, Reliability, Safety and RiskAdditional physical formats: Printed edition:: No titleDDC classification: 621.381 Online resources: Click here to access online
Contents:
Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
In: Springer eBooksSummary: This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
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Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.

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