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Fault-Tolerance Techniques for SRAM-Based FPGAs
by Kastensmidt, Fernanda, Lima | Carro, Luigi | Reis, Ricardo. Material type: Book; Format:
print
; Literary form:
Not fiction
Publisher: Netherlands Springer 2006Availability: Items available for loan:
[Call number: 621.395 K18]
(1).
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VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design [electronic resource] : 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, Santa Cruz, CA, USA, October 7-10, 2012, Revised Selected Papers / edited by Andreas Burg, Ayṣe Coṣkun, Matthew Guthaus, Srinivas Katkoori, Ricardo Reis.
by Burg, Andreas [editor.] | Coṣkun, Ayṣe [editor.] | Guthaus, Matthew [editor.] | Katkoori, Srinivas [editor.] | Reis, Ricardo [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Online access: Click here to access online Availability: No items available
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VLSI-SoC: At the Crossroads of Emerging Trends [electronic resource] : 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised Selected Papers / edited by Alex Orailoglu, H. Fatih Ugurdag, Lu�is Miguel Silveira, Martin Margala, Ricardo Reis.
by Orailoglu, Alex [editor.] | Ugurdag, H. Fatih [editor.] | Silveira, Lu�is Miguel [editor.] | Margala, Martin [editor.] | Reis, Ricardo [editor.] | SpringerLink (Online service). Edition: 1st ed. 2015.Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Online access: Click here to access online Availability: No items available
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Circuit Design for Reliability [electronic resource] / edited by Ricardo Reis, Yu Cao, Gilson Wirth.
by Reis, Ricardo [editor.] | Cao, Yu [editor.] | Wirth, Gilson [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: New York, NY : Springer New York : Imprint: Springer, 2015Online access: Click here to access online Availability: No items available
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VLSI-SoC: Design for Reliability, Security, and Low Power [electronic resource] : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers / edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis.
by Shin, Youngsoo [editor.] | Tsui, Chi Ying [editor.] | Kim, Jae-Joon [editor.] | Choi, Kiyoung [editor.] | Reis, Ricardo [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available
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Protecting Chips Against Hold Time Violations Due to Variability [electronic resource] / by Gustavo Neuberger, Gilson Wirth, Ricardo Reis.
by Neuberger, Gustavo [author.] | Wirth, Gilson [author.] | Reis, Ricardo [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Dordrecht : Springer Netherlands : Imprint: Springer, 2014Online access: Click here to access online Availability: No items available
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VLSI-SoC: Internet of Things Foundations [electronic resource] : 22nd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2014, Playa del Carmen, Mexico, October 6-8, 2014, Revised Selected Papers / edited by Luc Claesen, Maria-Teresa Sanz-Pascual, Ricardo Reis, Arturo Sarmiento-Reyes.
by Claesen, Luc [editor.] | Sanz-Pascual, Maria-Teresa [editor.] | Reis, Ricardo [editor.] | Sarmiento-Reyes, Arturo [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Online access: Click here to access online Availability: No items available
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs [electronic resource] / by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis.
by Zimpeck, Alexandra [author.] | Meinhardt, Cristina [author.] | Artola, Laurent [author.] | Reis, Ricardo [author.] | SpringerLink (Online service). Edition: 1st ed. 2021.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2021Online access: Click here to access online Availability: No items available
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Electromigration Inside Logic Cells [electronic resource] : Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS / by Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis.
by Posser, Gracieli [author.] | Sapatnekar, Sachin S [author.] | Reis, Ricardo [author.] | SpringerLink (Online service). Edition: 1st ed. 2017.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2017Online access: Click here to access online Availability: No items available
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Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices [electronic resource] / by Geancarlo Abich, Luciano Ost, Ricardo Reis.
by Abich, Geancarlo [author.] | Ost, Luciano [author.] | Reis, Ricardo [author.] | SpringerLink (Online service). Edition: 1st ed. 2023.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer Nature Switzerland : Imprint: Springer, 2023Online access: Click here to access online Availability: No items available
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