000 03107nam a22005655i 4500
001 978-1-4939-1349-7
003 DE-He213
005 20200420220216.0
007 cr nn 008mamaa
008 141203s2015 xxu| s |||| 0|eng d
020 _a9781493913497
_9978-1-4939-1349-7
024 7 _a10.1007/978-1-4939-1349-7
_2doi
050 4 _aTK7800-8360
050 4 _aTK7874-7874.9
072 7 _aTJF
_2bicssc
072 7 _aTEC008000
_2bisacsh
072 7 _aTEC008070
_2bisacsh
082 0 4 _a621.381
_223
100 1 _aBhushan, Manjul.
_eauthor.
245 1 0 _aCMOS Test and Evaluation
_h[electronic resource] :
_bA Physical Perspective /
_cby Manjul Bhushan, Mark B. Ketchen.
264 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2015.
300 _aXIII, 424 p. 338 illus.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aIntroduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
520 _aThis book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
650 0 _aEngineering.
650 0 _aSemiconductors.
650 0 _aQuality control.
650 0 _aReliability.
650 0 _aIndustrial safety.
650 0 _aElectronics.
650 0 _aMicroelectronics.
650 0 _aElectronic circuits.
650 1 4 _aEngineering.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aCircuits and Systems.
650 2 4 _aSemiconductors.
650 2 4 _aQuality Control, Reliability, Safety and Risk.
700 1 _aKetchen, Mark B.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781493913480
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4939-1349-7
912 _aZDB-2-ENG
942 _cEBK
999 _c51618
_d51618