000 | 03057nam a22005295i 4500 | ||
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001 | 978-3-319-00780-9 | ||
003 | DE-He213 | ||
005 | 20200421111657.0 | ||
007 | cr nn 008mamaa | ||
008 | 130917s2014 gw | s |||| 0|eng d | ||
020 |
_a9783319007809 _9978-3-319-00780-9 |
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024 | 7 |
_a10.1007/978-3-319-00780-9 _2doi |
|
050 | 4 | _aT174.7 | |
072 | 7 |
_aTDPB _2bicssc |
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072 | 7 |
_aTEC027000 _2bisacsh |
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082 | 0 | 4 |
_a620.5 _223 |
245 | 1 | 0 |
_aMEMS and Nanotechnology, Volume 5 _h[electronic resource] : _bProceedings of the 2013 Annual Conference on Experimental and Applied Mechanics / _cedited by Gordon Shaw III, Barton C. Prorok, LaVern Starman, Cosme Furlong. |
264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2014. |
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300 |
_aVIII, 134 p. 124 illus. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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347 |
_atext file _bPDF _2rda |
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490 | 1 |
_aConference Proceedings of the Society for Experimental Mechanics Series, _x2191-5644 |
|
505 | 0 | _aFrom the Contents: Warpage Measurement of Simulated Electronic Packaging Assembly -- Nanomechanical Characterization of Lead Free Solder Joints -- In-Situ Surface Mount Process Characterization Using Digital Image Correlation -- Acoustic Waveform Energy as an Interconnect Damage Indicator -- Shape Optimization of Cantilevered Piezoelectric Devices -- Unique Fabrication Method for Novel MEMS Micro-contact Structure -- A Frequency Selective Surface Design Fabricated With Tunable RF Meta-atoms -- Stress Characterization in Si/SiO2 Spherical Shells Used in Micro-Robotics. | |
520 | _aMEMS and Nanotechnology, Volume 5: Proceedings of the 2013 Annual Conference on Experimental and Applied Mechanics, the fifth volume of eight from the Conference, brings together contributions to this important area of research and engineering. The collection presents early findings and case studies on a wide range of areas, including: Microelectronics Packaging Single Atom/Molecule Mechanical Testing MEMS Devices & Fabrication In-Situ Mechanical Testing Nanoindentation Experimental Analysis of Low-Dimensional Materials for Nanotechnology. | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aMechanics. | |
650 | 0 | _aMechanics, Applied. | |
650 | 0 | _aNanotechnology. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aNanotechnology and Microengineering. |
650 | 2 | 4 | _aTheoretical and Applied Mechanics. |
650 | 2 | 4 | _aNanotechnology. |
700 | 1 |
_aShaw III, Gordon. _eeditor. |
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700 | 1 |
_aProrok, Barton C. _eeditor. |
|
700 | 1 |
_aStarman, LaVern. _eeditor. |
|
700 | 1 |
_aFurlong, Cosme. _eeditor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783319007793 |
830 | 0 |
_aConference Proceedings of the Society for Experimental Mechanics Series, _x2191-5644 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-319-00780-9 |
912 | _aZDB-2-ENG | ||
942 | _cEBK | ||
999 |
_c54751 _d54751 |