000 | 06536nam a2201537 i 4500 | ||
---|---|---|---|
001 | 5263941 | ||
003 | IEEE | ||
005 | 20200421114113.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 100317t20152001nyua ob 001 0 eng d | ||
020 |
_a9780470544556 _qelectronic |
||
020 |
_z9780780347434 _qprint |
||
020 |
_z0470544554 _qelectronic |
||
024 | 7 |
_a10.1109/9780470544556 _2doi |
|
035 | _a(CaBNVSL)mat05263941 | ||
035 | _a(IDAMS)0b000064810c3d72 | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
||
050 | 4 |
_aTK7867.5 _b.K63 2001eb |
|
082 | 0 | 4 |
_a621.382/24 _222 |
100 | 1 |
_aKodali, V. Prasad, _d1939- |
|
245 | 1 | 0 |
_aEngineering electromagnetic compatibility : _bprinciples, measurements, technologies, and computer models / _cV. Prasad Kodali. |
250 | _a2nd ed. | ||
264 | 1 |
_aNew York : _bInstitute of Electrical and Electronics Engineers, _cc2001. |
|
264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2001] |
|
300 |
_a1 PDF (xxii, 453 pages) : _billustrations. |
||
336 |
_atext _2rdacontent |
||
337 |
_aelectronic _2isbdmedia |
||
338 |
_aonline resource _2rdacarrier |
||
504 | _aIncludes bibliographical references and index. | ||
505 | 0 | _aPreface to First Edition. Preface to Second Edition. Introduction. Natural and Nuclear Sources of EMI. EMI From Apparatus and Circuits. Probabilistic and Statistical Physical Models. Open-Area Test Sites. Radiated Interference Measurements. Conducted Interference Measurements. Pulsed Interference Immunity. Grounding, Shielding, and Bonding. EMI Filters. Cables, Connectors, and Components. Frequency Assignment and Spectrum Conservation. EMC Computer Modeling and Simulation. Signal Integrity. EMC Standards. Selected Bibliography. Appendix 1: EMC Terminology. Appendix 2: EMI/EMC Units. Appendix 3: Books On Related Topics. Appendix 4: EMI/EMC Standards. Appendix 5: EMC e-Resources. Index. About The Author. | |
506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
520 | _aThis practical, enhanced second edition will teach you to avoid costly post-design electromagnetic compatibility (EMC) fixes. Once again, V. Prasad Kodali provides a comprehensive introduction to EMC and presents current technical information on sources of electromagnetic interference (EMI), EMC/EMI measurements, technologies to control EMI, computer simulation and design, and international EMC standards. Features added to this second edition include:. Two new chapters covering EMC computer modeling and simulation and signal integrity. Expanded assignments at the close of each chapter. Illustrative examples that enhance comprehension. A new appendix that lists a selected bibliography, important standards, and Web sites relevant to EMC/EMI Engineering Electromagnetic Compatibility, Second Edition is presented in a concise, user-friendly format that combines a rigorous solutions-based, mathematical treatment of the underlying theories of EMC with the most recent practical applications. It is ideally suited as a desk reference for practicing engineers and as a textbook for students who need to understand the form and function of EMC and its relevance to a variety of systems. | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web | ||
588 | _aDescription based on PDF viewed 12/21/2015. | ||
650 | 0 |
_aElectronic circuits _xNoise. |
|
650 | 0 | _aElectromagnetic compatibility. | |
655 | 0 | _aElectronic books. | |
695 | _aAnalytical models | ||
695 | _aAnechoic chambers | ||
695 | _aAntenna measurements | ||
695 | _aAntennas | ||
695 | _aAttenuation | ||
695 | _aBand pass filters | ||
695 | _aBandwidth | ||
695 | _aBibliographies | ||
695 | _aBiographies | ||
695 | _aBooks | ||
695 | _aCapacitors | ||
695 | _aClouds | ||
695 | _aCoaxial cables | ||
695 | _aComputational modeling | ||
695 | _aComputers | ||
695 | _aConductivity | ||
695 | _aConductors | ||
695 | _aContacts | ||
695 | _aCryptography | ||
695 | _aDipole antennas | ||
695 | _aDischarges | ||
695 | _aEarth | ||
695 | _aElectric shock | ||
695 | _aElectrodes | ||
695 | _aElectromagnetic compatibility | ||
695 | _aElectromagnetic compatibility and interference | ||
695 | _aElectromagnetic interference | ||
695 | _aElectromagnetics | ||
695 | _aElectrostatic discharge | ||
695 | _aElectrostatics | ||
695 | _aEquations | ||
695 | _aFault diagnosis | ||
695 | _aFault location | ||
695 | _aFiltering theory | ||
695 | _aFrequency measurement | ||
695 | _aFrequency modulation | ||
695 | _aGrounding | ||
695 | _aGuidelines | ||
695 | _aHome appliances | ||
695 | _aIEC standards | ||
695 | _aIEEE standards | ||
695 | _aImmunity testing | ||
695 | _aImpedance | ||
695 | _aIndexes | ||
695 | _aIndustries | ||
695 | _aInstruments | ||
695 | _aIntegrated circuit modeling | ||
695 | _aInterference | ||
695 | _aLayout | ||
695 | _aLightning | ||
695 | _aLogic gates | ||
695 | _aLow pass filters | ||
695 | _aMagnetic field measurement | ||
695 | _aMathematical model | ||
695 | _aMeasurement units | ||
695 | _aMicrowave antennas | ||
695 | _aMicrowave measurements | ||
695 | _aMicrowave theory and techniques | ||
695 | _aMilitary standards | ||
695 | _aNoise | ||
695 | _aNoise measurement | ||
695 | _aNumerical models | ||
695 | _aPassive filters | ||
695 | _aPhysics | ||
695 | _aPower harmonic filters | ||
695 | _aPower measurement | ||
695 | _aPower supplies | ||
695 | _aProbabilistic logic | ||
695 | _aRadio frequency | ||
695 | _aRadio spectrum management | ||
695 | _aRadio transmitters | ||
695 | _aReceivers | ||
695 | _aReceiving antennas | ||
695 | _aRelays | ||
695 | _aSemiconductor device measurement | ||
695 | _aSilicon | ||
695 | _aSoil | ||
695 | _aStandards | ||
695 | _aSurges | ||
695 | _aTerminology | ||
695 | _aTiming | ||
695 | _aTransient analysis | ||
695 | _aTransmission line measurements | ||
695 | _aTransmitting antennas | ||
695 | _aVoltage measurement | ||
710 | 2 |
_aJohn Wiley & Sons, _epublisher. |
|
710 | 2 | _aIEEE Electromagnetic Compatibility Society. | |
710 | 2 |
_aIEEE Xplore (Online service), _edistributor. |
|
776 | 0 | 8 |
_iPrint version: _z9780780347434 |
856 | 4 | 2 |
_3Abstract with links to resource _uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263941 |
942 | _cEBK | ||
999 |
_c59445 _d59445 |