000 00551 a2200181 4500
999 _c60557
_d60557
005 20210502220049.0
008 210502b ||||| |||| 00| 0 eng d
020 _a9784431565925
082 _a621.395 A80V
100 _aAsai, Shojiro
245 _aVLSI Design and Test for Systems Dependability
260 _bSpringer
_aJapan
_c2019
300 _ap.800
650 _bElectromagnetic Noises
650 _bVariations in Device Characteristics
650 _bDesign and Development of Electronic Systems for Quality and Dependability
942 _cBK