000			05802cam a2200625Ii 4500
001			ocn968156225
003			OCoLC
005			20220711203329.0
006			m o d
007			cr cnu---unuuu
008			170111s2017 gw a ob 001 0 eng d
040			_aN$T _beng _erda _epn _cN$T _dN$T _dOCLCO _dOCLCA _dN$T _dDG1 _dN$T
020			_a9783527684519 _qelectronic bk.
020			_a3527684514 _qelectronic bk.
020			_a9783527684502 _qelectronic bk.
020			_a3527684506 _qelectronic bk.
020			_a9783527684496 _qelectronic bk.
020			_a3527684492 _qelectronic bk.
020			_a9783527684489 _qelectronic bk.
020			_a3527684484 _qelectronic bk.
020			_z9783527335923
035			_a(OCoLC)968156225
050		4	_aQC787.S9 _bN48 2017
072		7	_aTEC _x009000 _2bisacsh
072		7	_aTEC _x035000 _2bisacsh
082	0	4	_a620.11272 _223
049			_aMAIN
112			_bWiley Online Library UBCM All Obooks
245	0	0	_aNeutrons and synchrotron radiation in engineering materials science : _bfrom fundamentals to applications / _cedited by Peter Staron, Andreas Schreyer, Helmut Clemens, and Svea Mayer.
250			_aSecond Edition.
264		1	_aWeinheim : _bWiley-VCH, _c[2017]
264		4	_c©2017
300			_a1 online resource (xxiv, 462 pages) : _billustrations
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
588	0		_aOnline resource; title from PDF title page (EBSCO, viewed February 1, 2017)
504			_aIncludes bibliographical references and index.
505	0		_aGeneral. Microstructure and Properties of Engineering Materials / Helmut Clemens, Svea Mayer, Christina Scheu -- Internal Stresses in Engineering Materials / Anke Kaysser-Pyzalla -- Textures in Engineering Materials / Heinz G Brokmeier, Sangbong Yi -- Physical Properties of Photons and Neutrons / Andreas Schreyer -- Radiation Sources / Ina Lommatzsch, Wolfgang Knop, Philipp K Pranzas, Peter Schreiner, Rolf Treusch -- Methods. Stress Analysis by Angle-Dispersive Neutron Diffraction / Peter Staron -- Stress Analysis by Energy-Dispersive Neutron Diffraction / Javier Santisteban -- Residual Stress Analysis by Monochromatic High-Energy X-rays / René V Martins -- Residual Stress Analysis by Energy-Dispersive Synchrotron X-ray Diffraction / Christoph Genzel, Manuela Klaus -- Texture Analyses by Synchrotron X-rays and Neutrons / Sangbong Yi, Weimin Gan, Heinz-G Brokmeier -- Basics of Small-Angle Scattering Methods / Philipp K Pranzas -- Small-Angle Neutron Scattering / Philipp K Pranzas, André Heinemann -- Anomalous Small-Angle X-ray Scattering / Ulla Vainio -- Imaging / Wolfgang Treimer -- Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomography / Felix Beckmann -- -Tomography of Engineering Materials / Astrid Haibel, Julia Herzen -- New and Emerging Methods. 3D X-ray Diffraction Microscope / Henning F Poulsen, Wolfgang Ludwig, Søren Schmidt -- 3D Micron-Resolution Laue Diffraction / Gene E Ice -- Applications. The Use of Neutron and Synchrotron Research for Aerospace and Automotive Materials and Components / Wolfgang Kaysser, Jörg Eßlinger, Volker Abetz, Norbert Huber, Karl U Kainer, Thomas Klassen, Florian Pyczak, Andreas Schreyer, Peter Staron -- In situ Experiments with Synchrotron High-Energy X-rays and Neutrons / Peter Staron, Torben Fischer, Thomas Lippmann, Andreas Stark, Shahrokh Daneshpour, Dirk Schnubel, Eckart Uhlmann, Robert Gerstenberger, Bettina Camin, Walter Reimers, Elisabeth Eidenberger-Schober, Helmut Clemens, Norbert Huber, Andreas Schreyer -- Application of Photons and Neutrons for the Characterization and Development of Advanced Steels / Elisabeth Eidenberger-Schober, Ronald Schnitzer, Gerald A Zickler, Michael Eidenberger-Schober, Michael Bischof, Peter Staron, Harald Leitner, Andreas Schreyer, Helmut Clemens -- The Contribution of High-Energy X-rays and Neutrons to Characterization and Development of Intermetallic Titanium Aluminides / Thomas Schmoelzer, Klaus-Dieter Liss, Peter Staron, Andreas Stark, Emanuel Schwaighofer, Thomas Lippmann, Helmut Clemens, Svea Mayer -- In situ Laue: Instrumental Setup for the Deformation of Micron Sized Samples / Christoph Kirchlechner, Jozef Keckes, Jean S Micha, Gerhard Dehm -- Residual Stresses in Thin Films and Coated Tools: Challenges and Strategies for Their Nondestructive Analysis by X-ray Diffraction Methods / Manuela Klaus, Christoph Genzel.
520			_aBesides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
650		0	_aSynchrotron radiation. _95802
650		0	_aMaterials _xTesting. _96592
650		0	_aMaterials _xAnalysis. _96593
650		0	_aMaterials _xEffect of radiation on. _96594
650		7	_aTECHNOLOGY & ENGINEERING / Engineering (General) _2bisacsh _96595
650		7	_aTECHNOLOGY & ENGINEERING / Reference _2bisacsh _96596
655		4	_aElectronic books. _93294
700	1		_aStaron, Peter, _eeditor. _96597
700	1		_aSchreyer, Andreas, _eeditor. _96598
700	1		_aClemens, Helmut, _eeditor. _96599
700	1		_aMayer, Svea, _eeditor. _96600
856	4	0	_uhttps://doi.org/10.1002/9783527684489 _zWiley Online Library
942			_cEBK
994			_a92 _bDG1
999			_c68698 _d68698