000 02061cam a2200529Ii 4500
001 ocn970041648
003 OCoLC
005 20220711203334.0
006 m o d
007 cr cnu|||unuuu
008 170126s2017 gw ob 001 0 eng d
040 _aN$T
_beng
_erda
_epn
_cN$T
_dDG1
_dIDEBK
_dN$T
020 _a9783527800308
_q(electronic bk. : oBook)
020 _a3527800301
_q(electronic bk. : oBook)
020 _a3527800050
_q(electronic bk. : ePDF)
020 _z9783527340392
_q(print)
020 _a9783527800056
_q(electronic bk.)
035 _a(OCoLC)970041648
050 4 _aT174.7
072 7 _aTEC
_x009000
_2bisacsh
072 7 _aTEC
_x035000
_2bisacsh
082 0 4 _a620/.5
_223
049 _aMAIN
112 _bWiley Online Library UBCM All Obooks
245 0 0 _aMetrology and standardization of nanotechnology :
_bprotocols and industrial innovations /
_cedited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
264 1 _aWeinheim, Germany :
_bWiley-VCH,
_c2017.
300 _a1 online resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aNanotechnology innovation & applications
504 _aIncludes bibliographical references and index.
588 0 _aOnline resource; title from PDF title page (John Wiley, viewed January 31, 2017).
650 0 _aNanotechnology.
_94707
650 0 _aMetrology.
_96667
650 7 _aTECHNOLOGY & ENGINEERING / Engineering (General)
_2bisacsh
_96668
650 7 _aTECHNOLOGY & ENGINEERING / Reference
_2bisacsh
_96669
655 4 _aElectronic books.
_93294
700 1 _aMansfield, Elisabeth,
_eeditor.
_96670
700 1 _aKaiser, Debra L.,
_eeditor.
_96671
700 1 _aFujita, Daisuke,
_eeditor.
_96672
700 1 _aVoorde, M. H. van de
_q(Marcel H.),
_eeditor.
_96673
830 0 _aNanotechnology innovation & applications.
_96674
856 4 0 _uhttps://doi.org/10.1002/9783527800308
_zWiley Online Library
942 _cEBK
994 _a92
_bDG1
999 _c68717
_d68717