000 02234cam a2200613Ki 4500
001 ocn898586972
003 OCoLC
005 20220711203400.0
006 m o d
007 cr cnu|||unuuu
008 141223s2014 enk ob 001 0 eng d
040 _aDG1
_beng
_erda
_epn
_cDG1
_dOCLCF
_dYDXCP
_dDEBBG
019 _a900564083
020 _a9783527680566
_qelectronic bk.
020 _a352768056X
_qelectronic bk.
020 _z9783527411566
020 _z3527411569
020 _z9783527411573
020 _z3527411577
020 _z9783527411580
020 _z3527411585
020 _z9783527411597
020 _z3527411593
024 7 _a10.1002/9783527680566
_2doi
029 1 _aCHVBK
_b334089050
029 1 _aCHBIS
_b010442250
029 1 _aGBVCP
_b821068652
029 1 _aDEBBG
_bBV043397400
035 _a(OCoLC)898586972
_z(OCoLC)900564083
050 4 _aQC173.4.S94
082 0 4 _a530.417
_223
049 _aMAIN
245 0 0 _aSurface and interface science.
_nVolume 4,
_pSolid-solid interfaces and thin films /
_cedited by Klaus Wandelt.
246 3 0 _aSolid-solid interfaces and thin films
264 1 _aWeinheim :
_bWiley-VCH,
_c2014.
300 _a1 online resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
504 _aIncludes bibliographical references and index.
588 0 _aOnline resource; title from PDF title page (John Wiley, viewed December 23, 2014).
650 0 _aSurfaces (Physics)
_96441
650 0 _aSurfaces (Technology)
_xAnalysis.
_96442
650 0 _aSurface chemistry.
_94753
650 7 _aSurface chemistry.
_2fast
_0(OCoLC)fst01139210
_94753
650 7 _aSurfaces (Physics)
_2fast
_0(OCoLC)fst01139265
_96441
650 7 _aSurfaces (Technology)
_xAnalysis.
_2fast
_0(OCoLC)fst01139279
_96442
655 4 _aElectronic books.
_93294
700 1 _aWandelt, K.
_q(Klaus),
_d1944-
_eeditor.
_97100
776 0 8 _cOriginal
_z9783527411566
_z3527411569
_z9783527411573
_z3527411577
_z9783527411580
_z3527411585
_z9783527411597
_z3527411593
_w(DLC) 2012405664
_w(OCoLC)768072885
856 4 0 _uhttps://doi.org/10.1002/9783527680566
_zWiley Online Library
942 _cEBK
994 _a92
_bDG1
999 _c68811
_d68811