000 | 04414cam a2200649 i 4500 | ||
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001 | on1154950222 | ||
003 | OCoLC | ||
005 | 20220711203712.0 | ||
006 | m o d | ||
007 | cr ||||||||||| | ||
008 | 200508t20212021njua ob 001 0 eng | ||
010 | _a 2020008265 | ||
040 |
_aDLC _beng _erda _epn _cDLC _dOCL _dOCLCO _dOCLCQ _dIEEEE _dDG1 _dOCLCQ _dYDX _dYUS |
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019 | _a1267358907 | ||
020 |
_a9781119076537 _qelectronic book |
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020 |
_a1119076536 _qelectronic book |
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020 |
_a9781119076544 _qelectronic book |
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020 |
_a1119076544 _qelectronic book |
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020 |
_a9781119076230 _qelectronic book |
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020 |
_a1119076234 _qelectronic book |
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020 |
_z9781119076469 _qhardcover |
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020 | _z1119076463 | ||
024 | 7 |
_a10.1002/9781119076230 _2doi |
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024 | _a16611138 | ||
029 | 1 |
_aAU@ _b000067196263 |
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035 |
_a(OCoLC)1154950222 _z(OCoLC)1267358907 |
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037 |
_a9516594 _bIEEE |
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042 | _apcc | ||
050 | 0 | 4 |
_aQC760 _b.M53 2021 |
082 | 0 | 0 |
_a537/.12 _223 |
049 | _aMAIN | ||
245 | 0 | 0 |
_aModern characterization of electromagnetic systems and its associated metrology / _cTapan K. Sarkar, Magdalena Salazar-Palma, Ming Da Zhu, Heng Chen. |
264 | 1 |
_aHoboken, NJ : _bJohn Wiley & Sons, Inc., _c2021. |
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264 | 4 | _c©2021 | |
300 |
_a1 online resource (xxviii, 692 pages) : _billustrations (some color) |
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336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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504 | _aIncludes bibliographical references and index. | ||
505 | 0 | _aMathematical Principles related to Modern system Analysis -- Matrix Pencil Method (MPM) -- The Cauchy Method -- Applications of the Hilbert Transform: A Nonparametric method for Interpolation/Extrapolation of data -- The Source Reconstruction Method -- Planar near-field to far-field transformation using a single moving probe and a fixed probe arrays -- Spherical Near-field to Far-field transformation -- Deconvolving Measured Electromagnetic Responses -- Performance of Different Functionals for Interpolation /Extrapolation of Near/Far Field Data -- Retrieval of free space radiation patterns from measured data in a non-anechoic environment. | |
520 |
_a"This book describes new method of characterization of electromagnetic wave dynamics and measurement, which are based on modern computational and digital signal processing techniques. The book introduces modern computational concepts in electromagnetic system characterization and introduce modern signal processing algorithms not only to enhance the resolution but also extract information from electromagnetic systems that is not currently possible, for example, generation of the non-minimum phase or for that matter the transient response given amplitude only data. The author covers model based parameter estimation and planar near field to far field transformation, as well as spherical near field to far field transformation. Electromagnetism is the physics of the electromagnetic field: a field, encompassing all of space, which exerts a force on those particles that possess a property known as electric charge, and is in turn affected by the presence and motion of such particles. The design of circuits that use the electromagnetic properties of electrical components such as resistors, capacitors, inductors, diodes and transistors to achieve a particular functionality."-- _cProvided by publisher |
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588 | _aDescription based on online resource; title from digital title page (viewed on September 08, 2021). | ||
590 | _bWiley Frontlist Obook All English 2021 | ||
650 | 0 |
_aElectromagnetism _xMathematics. _98597 |
|
650 | 0 |
_aElectromagnetic waves _xMeasurement. _910092 |
|
650 | 7 |
_aElectromagnetism _xMathematics. _2fast _0(OCoLC)fst00906600 _98597 |
|
650 | 7 |
_aElectromagnetic waves _xMeasurement. _2fast _0(OCoLC)fst00906581 _910092 |
|
655 | 4 |
_aElectronic books. _93294 |
|
700 | 1 |
_aSarkar, Tapan _q(Tapan K.), _eeditor. _910093 |
|
700 | 1 |
_aSalazar-Palma, Magdalena, _eeditor. _910094 |
|
700 | 1 |
_aZhu, Ming Da, _eeditor. _910095 |
|
700 | 1 |
_aChen, Heng, _d1990- _eeditor. _910096 |
|
776 | 0 | 8 |
_iPrint version: _tModern characterization of electromagnetic systems and its associated metrology. _dHoboken, NJ : Wiley, 2020 _z9781119076469 _w(DLC) 2020008264 |
856 | 4 | 0 |
_uhttps://doi.org/10.1002/9781119076230 _zWiley Online Library |
942 | _cEBK | ||
994 |
_a92 _bDG1 |
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999 |
_c69602 _d69602 |