000			03048cam a2200433Mi 4500
001			9781351368452
003			FlBoTFG
005			20220711212518.0
006			m o d
007			cr cn|||||||||
008			180112s2018 flu o 000 0 eng d
040			_aOCoLC-P _beng _erda _epn _cOCoLC-P
020			_a9781315150130 _q(e-book)
020			_a1315150131
020			_a9781351368452 _q(e-book ; _qPDF)
020			_a1351368451
035			_a(OCoLC)1019647037
035			_a(OCoLC-P)1019647037
050		4	_aQC451
082	0	4	_a535.84 _223
100	1		_aLee, Jian V., _eeditor. _917176
245	1	0	_aCapacitance Spectroscopy of Semiconductors / _ceditors, Ferrari, Giorgio.
250			_aFirst edition.
264		1	_aBoca Raton, FL : _bCRC Press, _c2018.
300			_a1 online resource : _btext file, PDF
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
520	2		_a"Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, in academia, national institutions, and industry, subdivided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. In the Physics section, we establish the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. In the Instrumentation section, we review the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. In the Applications section, we detail the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. In the Emerging Techniques section, we present the latest advances of capacitance-based electrical characterization aimed at reaching nanometer-scale resolution. This book is the first dedicated treatment of the subject of capacitance spectroscopy of semiconductors. This book caters to an audience with a wide background in materials science, electrical engineering, chemistry, and physics in various career stages from advanced undergraduate- and graduate-level students to professional researchers."--Provided by publisher.
588			_aOCLC-licensed vendor bibliographic record.
650		0	_aSpectrum analysis. _911993
650		0	_aSemiconductors. _93077
700	1		_aFerrari, Giorgio, _eeditor. _917177
856	4	0	_3Taylor & Francis _uhttps://www.taylorfrancis.com/books/9781351368452
856	4	0	_3Taylor & Francis _uhttps://www.taylorfrancis.com/books/9781315150130
856	4	2	_3OCLC metadata license agreement _uhttp://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
938			_aTaylor & Francis _bTAFR _n9781315150130
942			_cEBK
999			_c71454 _d71454