| 000 | 01346cam a2200313Ii 4500 | ||
|---|---|---|---|
| 001 | 9781315217819 | ||
| 008 | 180331s2014 fluad ob 001 0 eng d | ||
| 020 |
_a9781315217819 _q(e-book : PDF) |
||
| 020 |
_a9781351825016 _q(e-book: Mobi) |
||
| 020 |
_a9781439829424 _q(e-book: PDF) |
||
| 020 |
_z9781439829417 _q(hardback) |
||
| 020 |
_z9781138075771 _q(paperback) |
||
| 024 | 7 |
_a10.1201/b15549 _2doi |
|
| 035 | _a(OCoLC)859916982 | ||
| 050 | 4 |
_aTK7871.99.M44 _bT43 2014 |
|
| 082 | 0 | 4 |
_a621.39732 _bT344 |
| 245 | 0 | 0 |
_aTesting for small-delay defects in nanoscale CMOS integrated circuits / _cedited by Sandeep K. Goel, Krishnendu Chakrabarty. |
| 264 | 1 |
_aBoca Raton : _bCRC Press, _c2014. |
|
| 300 | _a1 online resource | ||
| 490 | 1 | _aDevices, circuits, and systems | |
| 505 | 0 | _asection 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics. | |
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xTesting. _917568 |
|
| 700 | 1 |
_aGoel, Sandeep K, _eeditor of compilation. _917569 |
|
| 700 | 1 |
_aChakrabarty, Krishnendu, _eeditor of compilation. _914047 |
|
| 776 | 0 | 8 |
_iPrint version: _z9781439829417 _w(DLC) 2013028538 |
| 830 | 0 |
_aDevices, circuits, and systems. _912115 |
|
| 856 | 4 | 0 |
_uhttps://www.taylorfrancis.com/books/9781315217819 _zClick here to view. |
| 942 | _cEBK | ||
| 999 |
_c71564 _d71564 |
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