| 000 | 01578cam a2200301Ii 4500 | ||
|---|---|---|---|
| 001 | 9781420008302 | ||
| 008 | 180706s2007 flua ob 001 0 eng d | ||
| 020 |
_a9781420008302 _q(e-book : PDF) |
||
| 020 |
_a9781315221649 _q(e-book) |
||
| 020 |
_a9781351828840 _q(e-book: Mobi) |
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| 020 |
_z9780849390098 _q(hardback) |
||
| 024 | 7 |
_a10.1201/9781315221649 _2doi |
|
| 035 | _a(OCoLC)85841297 | ||
| 050 | 4 |
_aR857.B5 _bC4553 2007 |
|
| 082 | 0 | 4 |
_a610.28 _bC435 |
| 100 | 1 |
_aChakrabarty, Krishnendu, _eauthor. _914047 |
|
| 245 | 1 | 0 |
_aDigital microfluidic biochips : _bsynthesis, testing, and reconfiguration techniques / _cKrishnendu Chakrabarty, Fei Su. |
| 264 | 1 |
_aBoca Raton, FL : _bCRC/Taylor & Francis, _c2007. |
|
| 300 | _a1 online resource (228 pages) | ||
| 504 | _aIncludes bibliographical references (pages 207-214) and index. | ||
| 505 | 0 | _achapter 1 PART I -- chapter 2 Architectural-Level Synthesis -- chapter 3 Module Placement -- chapter 4 Unified Synthesis Methodology -- chapter 5 Droplet Routing -- chapter 6 PART II -- chapter 7 Test Planning -- chapter 8 Concurrent Testing -- chapter 9 Defect-Oriented Testing and Diagnosis -- chapter 10 PART III -- chapter 11 Defect Tolerance Based on Space Redundancy -- chapter 12 Defect Tolerance Based on Graceful Degradation -- chapter 13 Conclusions and Future Work. | |
| 650 | 0 |
_aBiochips. _912941 |
|
| 650 | 0 |
_aMicrofluidics. _94240 |
|
| 700 | 1 |
_aSu, Fei. _920034 |
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| 776 | 0 | 8 |
_iPrint version: _z9780849390098 |
| 856 | 4 | 0 |
_uhttps://www.taylorfrancis.com/books/9781420008302 _zClick here to view. |
| 942 | _cEBK | ||
| 999 |
_c72266 _d72266 |
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