000 02028cam a2200421Ii 4500
001 9781315366708
008 180331t20172017fluacd ob 001 0 eng d
020 _a9781315366708
_q(e-book : PDF)
020 _a9781498758123
_q(e-book: PDF)
020 _a9781498784511
_q(e-book: Mobi)
020 _z9781498758116
_q(hardback)
024 7 _a10.1201/9781315366708
_2doi
035 _a(OCoLC)960209917
040 _aFlBoTFG
_cFlBoTFG
_erda
050 4 _aQC355.3
_b.D4 2017
082 0 4 _a535
_bD494
100 1 _aDe Villiers, Geoffrey,
_eauthor.
_920128
245 1 4 _aThe limits of resolution /
_cGeoffrey de Villiers, University of Birmingham, E. Roy Pike, King's College London.
264 1 _aBoca Raton :
_bCRC Press,
_c[2017]
264 4 _c©2017
300 _a1 online resource
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
490 1 _aSeries in optics and optoelectronics ;
_v22
500 _aA Taylor and Francis book.
505 0 _a1. Early concepts of resolution -- 2. Beyond the 2WT theorem -- 3. Elementary functional analysis -- 4. Resolution and ill-posedness -- 5. Optimisation -- 6. Deterministic methods for linear inverse problems -- 7. Convolution equations and deterministic spectral analysis -- 8. Statistical methods and resolution -- 9. Some applications in scattering and absorption -- 10. Resolution in microscopy.
650 0 _aResolution (Optics)
_920129
650 0 _aInverse problems (Differential equations)
_xNumerical solutions.
_920130
650 0 _aDifferential equations, Partial
_xImproperly posed problems.
_920131
650 0 _aFunctional analysis.
_912284
650 0 _aHigh resolution imaging.
_911219
700 1 _aPike, E. R.
_q(Edward Roy),
_d1929-
_eauthor.
_920132
776 0 8 _iPrint version:
_z9781498758116
_w(DLC) 2016013914
830 0 _aSeries in optics and optoelectronics (CRC Press) ;
_v22.
_911005
856 4 0 _uhttps://www.taylorfrancis.com/books/9781315366708
_zClick here to view.
942 _cEBK
999 _c72296
_d72296