000 | 04292nam a2200649 i 4500 | ||
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001 | 7109383 | ||
003 | IEEE | ||
005 | 20220712204841.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 151229s2015 maua ob 001 eng d | ||
010 | _z 2015000540 (print) | ||
020 |
_a9780262330244 _qelectronic |
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020 |
_z9780262029353 _qhardcover : print |
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035 | _a(CaBNVSL)mat07109383 | ||
035 | _a(IDAMS)0b00006483f6f10a | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
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043 | _an-us--- | ||
050 | 4 |
_aUA23 _b.D443 2015eb |
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082 | 0 | 0 |
_a355.801/1 _223 |
100 | 1 |
_aDelaney, William P., _d1933- _eauthor. _924621 |
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245 | 1 | 0 |
_aPerspectives on defense systems analysis : _bthe what, the why, and the who, but mostly the how of broad defense systems analysis / _cWilliam P. Delaney ; with Robert G. Atkins, Alan D. Bernard, Don M. Boroson, David J. Ebel, Aryeh Feder, Jack G. Fleischman, Michael P. Shatz, Robert Stein, and Stephen D. Weiner. |
264 | 1 |
_aCambridge, Massachusetts : _bMIT Press, _c[2015] |
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264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2015] |
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300 |
_a1 PDF (xiii, 273 pages) : _billustrations. |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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490 | 1 | _aMIT Lincoln Laboratory series | |
504 | _aIncludes bibliographical references. | ||
506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
520 | _aThe Department of Defense and the military continually grapple with complex scientific, engineering, and technological problems. Defense systems analysis offers a way to reach a clearer understanding of how to approach and think about complex problems. It guides analysts in defining the question, capturing previous work in the area, assessing the principal issues, and understanding how they are linked. The goal of defense systems analysis is not necessarily to find a particular solution but to provide a roadmap to a solution, or an understanding of the relative value of alternative solutions. In this book, experts in the field--all of them with more than twenty years of experience--offer insights, advice, and concrete examples to guide practitioners in the art of defense systems analysis.The book describes general issues in systems analysis and analysis protocols in specific defense areas. It offers a useful overview of the process, a discussion of different venues, and practical advice running a study and reporting its results. It discusses red teaming (the search for vulnerabilities that might be exploited by an adversary) and its complement, blue teaming (the search for solutions to known shortcomings). It describes real-world defense systems analysis for both traditional and nontraditional areas, including air defense and ballistic missile defense systems, bioterrorism defense, space warfare, and interplanetary communications. Perspectives on Defense Systems Analysis is a very readable resource for analysts and engineers in industry, government, and research. | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web | ||
588 | _aDescription based on PDF viewed 12/29/2015. | ||
610 | 1 | 0 |
_aUnited States. _bDepartment of Defense _xManagement. _924622 |
650 | 0 |
_aSystem analysis. _93242 |
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650 | 0 |
_aMilitary research _zUnited States _xEvaluation. _924623 |
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650 | 0 |
_aMilitary planning _zUnited States _xMethodology. _924624 |
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650 | 0 |
_aTechnology and state _zUnited States. _923324 |
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651 | 0 |
_aUnited States _xDefenses _xEvaluation _xMethodology. _924625 |
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651 | 0 |
_aUnited States _xArmed Forces _xWeapons systems _xEvaluation. _924626 |
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655 | 0 |
_aElectronic books. _93294 |
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695 | _aEpitaxial layers | ||
695 | _aExcitons | ||
695 | _aNitrogen | ||
695 | _aRadiative recombination | ||
695 | _aSilicon carbide | ||
695 | _aTemperature measurement | ||
710 | 2 |
_aIEEE Xplore (Online Service), _edistributor. _924627 |
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710 | 2 |
_aMIT Press, _epublisher. _924628 |
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710 | 2 |
_aLincoln Laboratory. _924629 |
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776 | 0 | 8 |
_iPrint version: _z9780262029353 |
830 | 0 |
_aMIT Lincoln Laboratory series _924630 |
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856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=7109383 |
942 | _cEBK | ||
999 |
_c73422 _d73422 |