000 04834nam a2201069 i 4500
001 5237008
003 IEEE
005 20220712205608.0
006 m o d
007 cr |n|||||||||
008 151221s2004 njua ob 001 eng d
010 _z 2003063488 (print)
020 _a9780471644651
_qebook
020 _z047143308X
_qcloth
020 _z9780471433088
_qcloth
020 _z047164465X
_qelectronic
024 7 _a10.1002/047164465X
_2doi
035 _a(CaBNVSL)mat05237008
035 _a(IDAMS)0b000064810951e1
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7867.2
_bM66 2004eb
082 0 0 _a621.382/24
_222
100 1 _aMontrose, Mark I.,
_eauthor.
_926384
245 1 0 _aTesting for EMC compliance :
_bapproaches and techniques /
_cMark I. Montrose, Edward M. Nakauchi.
264 1 _aHoboken, New Jersey :
_bJohn Wiley,
_c2004.
264 2 _a[Piscataqay, New Jersey] :
_bIEEE Xplore,
_c[2004]
300 _a1 PDF (xviii, 460 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references (p. 447-451) and index.
505 0 _a1. Introduction. -- 2. Electric, Magnetic, and Static Fields. -- 3. Instrumentation. -- 4. Test Facilities. -- 5. Probes, Antennas, and Support Equipment. -- 6. Conducted Testing. -- 7. Radiated Testing. -- 8. General Approaches Troubleshooting. -- 9. On-Site Troubleshooting Techniques. -- Appendix A: Building Probes. -- Appendix B: Test Procedures. -- Glossary. -- Bibliography. -- Index. -- About the Authors.
506 1 _aRestricted to subscribers or individual electronic text purchasers.
520 _aThe Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. This text tells engineers what to do and how to do it. Only a basic knowledge of math, electronics, and a basic understanding of EMI/EMC are necessary to understand the concepts and circuits described. Once EMC troubleshooting is demystified, readers learn there are quick and simple techniques to solve complicated problems a key aspect of this book. Simple and inexpensive methods to resolve EMI issues are discussed to help generate unique ideas and methods for developing additional diagnostic tools and measurement procedures. An appendix on how to build probes is included. It can be a fun activity, even humorous at times with bizarre techniques (i.e., the sticky finger probe).
530 _aAlso available in print.
538 _aMode of access: World Wide Web
550 _aMade available online by Ebrary.
588 _aDescription based on PDF viewed 12/21/2015.
588 _aTitle from title screen (viewed Aug. 17, 2004).
650 0 _aElectromagnetic compatibility.
_97508
650 0 _aElectromagnetic interference.
_96583
655 0 _aElectronic books.
_93294
695 _aAdaptive arrays
695 _aAntenna measurements
695 _aBandwidth
695 _aBibliographies
695 _aBiographies
695 _aConductors
695 _aCouplings
695 _aCurrent measurement
695 _aDipole antennas
695 _aElectric fields
695 _aElectromagnetic compatibility
695 _aElectromagnetic interference
695 _aFerrites
695 _aFrequency measurement
695 _aHorn antennas
695 _aImmune system
695 _aImmunity testing
695 _aImpedance
695 _aIndexes
695 _aLaboratories
695 _aLow pass filters
695 _aMagnetic field measurement
695 _aMagnetic shielding
695 _aMagnetostatic waves
695 _aMagnetostatics
695 _aMetals
695 _aNoise
695 _aOpen area test sites
695 _aOscilloscopes
695 _aPower cables
695 _aPower transmission lines
695 _aProbes
695 _aRLC circuits
695 _aRadio frequency
695 _aReceiving antennas
695 _aStandards
695 _aTerminology
695 _aTesting
695 _aTime domain analysis
695 _aTransducers
695 _aTransmission line measurements
695 _aVoltage measurement
695 _aWire
700 1 _aNakauchi, Edward M.
_926385
710 2 _aIEEE Xplore (Online Service),
_edistributor.
_926386
710 2 _aJohn Wiley & Sons,
_epublisher.
_96902
776 0 8 _iPrint version:
_z9780471433088
856 4 2 _3Abstract with links to resource
_uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008
942 _cEBK
999 _c73756
_d73756