| 000 | 04858nam a2201189 i 4500 | ||
|---|---|---|---|
| 001 | 5266057 | ||
| 003 | IEEE | ||
| 005 | 20220712205703.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 100317t20151990nyua ob 001 0 eng d | ||
| 020 |
_a9780470544389 _qelectronic |
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| 020 |
_z9780780310629 _qprint |
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| 020 |
_z0470544384 _qelectronic |
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| 024 | 7 |
_a10.1109/9780470544389 _2doi |
|
| 035 | _a(CaBNVSL)mat05266057 | ||
| 035 | _a(IDAMS)0b000064810c5c91 | ||
| 040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
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| 050 | 4 |
_aTK7874 _b.A23 1990eb |
|
| 082 | 0 | 4 |
_a621.381/5 _222 |
| 100 | 1 |
_aAbramovici, Miron, _eauthor. _927029 |
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| 245 | 1 | 0 |
_aDigital systems testing and testable design / _cMiron Abramovici, Melvin A. Breuer, Arthur D. Friedman. |
| 264 | 1 |
_aNew York, NY : _bComputer Science Press, _cc1990. |
|
| 264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[1994] |
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| 300 |
_a1 PDF (xxi, 653 pages) : _billustrations. |
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| 336 |
_atext _2rdacontent |
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| 337 |
_aelectronic _2isbdmedia |
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| 338 |
_aonline resource _2rdacarrier |
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| 490 | 1 | _aElectrical engineering, communications, and signal processing | |
| 504 | _aIncludes bibliographical references (p. 644-645) and index. | ||
| 505 | 0 | _aPreface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index. | |
| 506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
| 520 | _aThis updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field. | ||
| 530 | _aAlso available in print. | ||
| 538 | _aMode of access: World Wide Web | ||
| 588 | _aDescription based on PDF viewed 12/21/2015. | ||
| 650 | 0 |
_aDigital integrated circuits _xTesting. _920440 |
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| 650 | 0 |
_aDigital integrated circuits _xDesign and construction. _927030 |
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| 655 | 0 |
_aElectronic books. _93294 |
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| 695 | _aData models | ||
| 695 | _aData structures | ||
| 695 | _aDecoding | ||
| 695 | _aDesign for testability | ||
| 695 | _aDictionaries | ||
| 695 | _aDigital systems | ||
| 695 | _aDiscrete Fourier transforms | ||
| 695 | _aElectrical fault detection | ||
| 695 | _aEnvironmental factors | ||
| 695 | _aEquations | ||
| 695 | _aError correction codes | ||
| 695 | _aFabrication | ||
| 695 | _aFault detection | ||
| 695 | _aFault diagnosis | ||
| 695 | _aFeedback loop | ||
| 695 | _aGenerators | ||
| 695 | _aGold | ||
| 695 | _aHardware | ||
| 695 | _aIndexes | ||
| 695 | _aIntegrated circuit interconnections | ||
| 695 | _aIntegrated circuit modeling | ||
| 695 | _aIntegrated circuits | ||
| 695 | _aLogic functions | ||
| 695 | _aLogic gates | ||
| 695 | _aMaintenance engineering | ||
| 695 | _aMicroprocessors | ||
| 695 | _aObject oriented modeling | ||
| 695 | _aObservability | ||
| 695 | _aOscillators | ||
| 695 | _aParity check codes | ||
| 695 | _aProgrammable logic arrays | ||
| 695 | _aPrototypes | ||
| 695 | _aRadiation detectors | ||
| 695 | _aRedundancy | ||
| 695 | _aRegisters | ||
| 695 | _aSequential circuits | ||
| 695 | _aSequential diagnosis | ||
| 695 | _aSoftware | ||
| 695 | _aSufficient conditions | ||
| 695 | _aSynchronization | ||
| 695 | _aTarget tracking | ||
| 695 | _aTesting | ||
| 695 | _aTiming | ||
| 695 | _aAlgorithm design and analysis | ||
| 695 | _aAnalytical models | ||
| 695 | _aBooks | ||
| 695 | _aBoolean functions | ||
| 695 | _aBuilt-in self-test | ||
| 695 | _aCircuit faults | ||
| 695 | _aCircuit synthesis | ||
| 695 | _aCombinational circuits | ||
| 695 | _aComplexity theory | ||
| 695 | _aComputational modeling | ||
| 695 | _aControllability | ||
| 700 | 1 |
_aBreuer, Melvin A. _927031 |
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| 700 | 1 |
_aFriedman, Arthur D. _927032 |
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| 710 | 2 |
_aJohn Wiley & Sons, _epublisher. _96902 |
|
| 710 | 2 |
_aIEEE Xplore (Online service), _edistributor. _927033 |
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| 776 | 0 | 8 |
_iPrint version: _z9780780310629 |
| 830 | 0 |
_aElectrical engineering, communications, and signal processing _927034 |
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| 856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057 |
| 942 | _cEBK | ||
| 999 |
_c73947 _d73947 |
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