000			06412nam a2201357 i 4500
001			6047596
003			IEEE
005			20220712205816.0
006			m o d
007			cr |n|||||||||
008			151221s2012 njua ob 001 eng d
010			_z 2011002191 (print)
020			_a9781118084328 _qebook
020			_z9781118084311 _qepub
020			_z9781118084301 _qPDF
020			_z9780470767498 _qhardback
024	7		_a10.1002/9781118084328 _2doi
035			_a(CaBNVSL)mat06047596
035			_a(IDAMS)0b00006481692a6d
040			_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL
050		4	_aTL3000 _b.P48 2011eb
082	0	0	_a629.1 _222
100	1		_aPetersen, Edward, _d1932- _927855
245	1	0	_aSingle event effects in aerospace / _cEdward Petersen.
264		1	_aPiscataway, New Jersey : _bIEEE Press, _cc2011.
264		2	_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2012]
300			_a1 PDF (xiii, 502 pages) : _billustrations.
336			_atext _2rdacontent
337			_aelectronic _2isbdmedia
338			_aonline resource _2rdacarrier
504			_aIncludes bibliographical references (p. 455-487) and indexes.
505	0		_aIntroduction -- Foundations of Single Event Analysis and Prediction -- Optimizing Heavy Ion Experiments for Analysis -- Optimizing Proton Testing -- Data Qualification and Interpretation -- Analysis of Various Types of SEU Data -- Cosmic Ray Single Event Rate Calculations -- Proton Single Event Rate Calculations -- Neutron Induced Upset -- Upsets Produced by Heavy Ion Nuclear Reactions -- Samples of Heavy Ion Rate Prediction -- Samples of Proton Rate Predictions -- Combined Environments -- Samples of Solar Events and Extreme Situations -- Upset Rates in Neutral Particle Beam (NPB) Environments -- Predictions and Observations of SEU Rates in space -- Limitations of the IRPP Approach --
506	1		_aRestricted to subscribers or individual electronic text purchasers.
520			_aEnables readers to better understand, calculate, and manage single event effectsSingle event effects, caused by single ionizing particles that penetrate sensitive nodes within an electronic device, can lead to anything from annoying system responses to catastrophic system failures. As electronic components continue to become smaller and smaller due to advances in miniaturization, electronic components designed for avionics are increasingly susceptible to these single event phenomena. With this book in hand, readers learn the core concepts needed to understand, predict, and manage disruptive and potentially damaging single event effects.Setting the foundation, the book begins with a discussion of the radiation environments in space and in the atmosphere. Next, the book draws together and analyzes some thirty years of findings and best practices reported in the literature, exploring such critical topics as:. Design of heavy ion and proton experiments to optimize the data needed for single event predictions. Data qualification and analysis, including multiple bit upset and parametric studies of device sensitivity. Pros and cons of different approaches to heavy ion, proton, and neutron rate predictions. Results of experiments that have tested space predictionsSingle Event Effects in Aerospace is recommended for engineers who design or fabricate parts, subsystems, or systems used in avionics, missile, or satellite applications. It not only provides them with a current understanding of single event effects, it also enables them to predict single event rates in aerospace environments in order to make needed design adjustments.
530			_aAlso available in print.
538			_aMode of access: World Wide Web
588			_aDescription based on PDF viewed 12/21/2015.
650		0	_aElectromagnetic pulse. _99935
650		0	_aElectronic apparatus and appliances _xEffect of radiation on. _927856
650		0	_aAstrionics _xProtection. _927857
655		0	_aElectronic books. _93294
695			_aAerospace electronics
695			_aAerospace engineering
695			_aAlpha particles
695			_aAnalytical models
695			_aApproximation methods
695			_aAtmospheric measurements
695			_aAtmospheric modeling
695			_aBelts
695			_aCMOS integrated circuits
695			_aComputers
695			_aCorrelation
695			_aCosmic rays
695			_aDiffusion processes
695			_aDosimetry
695			_aEarth
695			_aEnergy loss
695			_aEquations
695			_aErbium
695			_aError analysis
695			_aExponential distribution
695			_aExtraterrestrial measurements
695			_aFault tolerance
695			_aFault tolerant systems
695			_aField programmable gate arrays
695			_aForce
695			_aGaussian distribution
695			_aGeometry
695			_aHelium
695			_aIndexes
695			_aInstruments
695			_aIntegrated circuit modeling
695			_aIonization
695			_aIron
695			_aJunctions
695			_aLead
695			_aLimiting
695			_aLow earth orbit satellites
695			_aMOS devices
695			_aMathematical model
695			_aMeasurement uncertainty
695			_aMonitoring
695			_aMonte Carlo methods
695			_aNASA
695			_aNeutrons
695			_aOrbits
695			_aParticle beam measurements
695			_aParticle beams
695			_aPower capacitors
695			_aProbability
695			_aProtons
695			_aRadiation detectors
695			_aRadiation effects
695			_aRandom access memory
695			_aScattering
695			_aSections
695			_aSemiconductor device measurement
695			_aSemiconductor device modeling
695			_aSensitivity
695			_aShape
695			_aSilicon
695			_aSingle event upset
695			_aSolids
695			_aSpace missions
695			_aSpace vehicles
695			_aSystematics
695			_aTesting
695			_aTransient analysis
695			_aTungsten
695			_aWeapons
710	2		_aIEEE Xplore (Online Service), _edistributor. _927858
710	2		_aJohn Wiley & Sons, _epublisher. _96902
776	0	8	_iPrint version: _z9780470767498
856	4	2	_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6047596
942			_cEBK
999			_c74194 _d74194