| 000 | 02843nam a22005055i 4500 | ||
|---|---|---|---|
| 001 | 978-981-10-0884-9 | ||
| 003 | DE-He213 | ||
| 005 | 20220801222815.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 160413s2016 si | s |||| 0|eng d | ||
| 020 |
_a9789811008849 _9978-981-10-0884-9 |
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| 024 | 7 |
_a10.1007/978-981-10-0884-9 _2doi |
|
| 050 | 4 | _aTK7867-7867.5 | |
| 072 | 7 |
_aTJFC _2bicssc |
|
| 072 | 7 |
_aTEC008010 _2bisacsh |
|
| 072 | 7 |
_aTJFC _2thema |
|
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 |
_aYuan, Jiann-Shiun. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _963464 |
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| 245 | 1 | 0 |
_aCMOS RF Circuit Design for Reliability and Variability _h[electronic resource] / _cby Jiann-Shiun Yuan. |
| 250 | _a1st ed. 2016. | ||
| 264 | 1 |
_aSingapore : _bSpringer Nature Singapore : _bImprint: Springer, _c2016. |
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| 300 |
_aVI, 106 p. 101 illus. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
||
| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
||
| 490 | 1 |
_aSpringerBriefs in Reliability, _x2196-1131 |
|
| 505 | 0 | _aCMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability. | |
| 520 | _aThe subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations. | ||
| 650 | 0 |
_aElectronic circuits. _919581 |
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| 650 | 0 |
_aTelecommunication. _910437 |
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| 650 | 1 | 4 |
_aElectronic Circuits and Systems. _963465 |
| 650 | 2 | 4 |
_aMicrowaves, RF Engineering and Optical Communications. _931630 |
| 710 | 2 |
_aSpringerLink (Online service) _963466 |
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| 773 | 0 | _tSpringer Nature eBook | |
| 776 | 0 | 8 |
_iPrinted edition: _z9789811008825 |
| 776 | 0 | 8 |
_iPrinted edition: _z9789811008832 |
| 830 | 0 |
_aSpringerBriefs in Reliability, _x2196-1131 _963467 |
|
| 856 | 4 | 0 | _uhttps://doi.org/10.1007/978-981-10-0884-9 |
| 912 | _aZDB-2-ENG | ||
| 912 | _aZDB-2-SXE | ||
| 942 | _cEBK | ||
| 999 |
_c81179 _d81179 |
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