000			02896nam a22003738i 4500
001			CR9780511735097
003			UkCbUP
005			20230516164906.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			100325s2004||||enk o ||1 0|eng|d
020			_a9780511735097 (ebook)
020			_z9780521453738 (hardback)
020			_z9780521184021 (paperback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aQC176.84.S93 _bI24 2004
082	0	0	_a530.4/275 _222
100	1		_aIchimiya, Ayahiko, _d1940- _eauthor. _967949
245	1	0	_aReflection high-energy electron diffraction / _cAyahiko Ichimiya and Philip I. Cohen.
264		1	_aCambridge : _bCambridge University Press, _c2004.
300			_a1 online resource (xi, 353 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
505	0		_aHistorical survey -- Instrumentation -- Wave properties of electrons -- The diffraction conditions -- Geometrical features of the pattern -- Kikuchi and resonance patterns -- Real diffraction patterns -- Electron scattering by atoms -- Kinematic electron diffraction -- Fourier components of the crystal potential -- Dynamical theory : transfer matrix method -- Dynamical theory : embedded R-matrix method -- Dynamical theory : integral method -- Structural analysis of crystal surfaces -- Inelastic scattering in a crystal -- Weakly disordered surfaces -- Strongly disordered surfaces -- RHEED intensity oscillations.
520			_aReflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This 2004 book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.
650		0	_aReflection high energy electron diffraction. _967950
650		0	_aThin films _xSurfaces _xAnalysis. _967951
700	1		_aCohen, Philip I., _eauthor. _967952
776	0	8	_iPrint version: _z9780521453738
856	4	0	_uhttps://doi.org/10.1017/CBO9780511735097
942			_cEBK
999			_c82187 _d82187