000			02143nam a2200349 i 4500
001			CR9780511754715
003			UkCbUP
005			20230516164927.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			100422s2003||||enk o ||1 0|eng|d
020			_a9780511754715 (ebook)
020			_z9780521822817 (hardback)
020			_z9780521529778 (paperback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aTA418.9.T45 _bF74 2003
082	0	0	_a621.3815/2 _221
100	1		_aFreund, L. B., _eauthor. _968261
245	1	0	_aThin film materials : _bstress, defect formation, and surface evolution / _cL.B. Freund, S. Suresh.
264		1	_aCambridge : _bCambridge University Press, _c2003.
300			_a1 online resource (xviii, 750 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
520			_aThin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
650		0	_aThin films. _97674
700	1		_aSuresh, S. _q(Subra), _eauthor. _968262
776	0	8	_iPrint version: _z9780521822817
856	4	0	_uhttps://doi.org/10.1017/CBO9780511754715
942			_cEBK
999			_c82311 _d82311