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020 _a9783031797910
_9978-3-031-79791-0
024 7 _a10.1007/978-3-031-79791-0
_2doi
050 4 _aT1-995
072 7 _aTBC
_2bicssc
072 7 _aTEC000000
_2bisacsh
072 7 _aTBC
_2thema
082 0 4 _a620
_223
100 1 _aMarshall, Andrew.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_983686
245 1 0 _aMismatch and Noise in Modern IC Processes
_h[electronic resource] /
_cby Andrew Marshall.
250 _a1st ed. 2009.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2009.
300 _aX, 139 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSynthesis Lectures on Digital Circuits & Systems,
_x1932-3174
505 0 _aPart I: Mismatch -- Introduction -- Variability and Mismatch in Digital Systems -- Variability and Mismatch in Analog Systems I -- Variability and Mismatch in Analog Systems II -- Lifetime-Induced Variability -- Mismatch in Nonconventional Processes -- Mismatch Correction Circuits -- Part II: Noise -- Component and Digital Circuit Noise -- Noise Effects in Digital Systems -- Noise Effects in Analog Systems -- Circuit Design to Minimize Noise Effects -- Noise Considerations in SOI.
520 _aComponent variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated circuits, from the perspective of a circuit designer. Variability usually refers to a large scale variation that can occur on a wafer to wafer and lot to lot basis, and over long distances on a wafer. This phenomenon is well understood and the effects of variability are included in most integrated circuit design with the use of corner or statistical component models. Mismatch, which is the emphasis of section I of the book, is a local level of variability that leaves the characteristics of adjacent transistors unmatched. This is of particular concern in certain analog and memory systems, but also has an effect on digital logic schemes, where uncertainty is introduced into delay times, which can reduce margins and introduce 'race' conditions. Noise is a dynamic effect that causes a local mismatch or variability that can vary during operation of a circuit, and is considered in section II. Noise can be the result of atomic effects in devices or circuit interactions, and both of these are discussed in terms of analog and digital circuitry. Table of Contents: Part I: Mismatch / Introduction / Variability and Mismatch in Digital Systems / Variability and Mismatch in Analog Systems I / Variability and Mismatch in Analog Systems II / Lifetime-Induced Variability / Mismatch in Nonconventional Processes / Mismatch Correction Circuits / Part II: Noise / Component and Digital Circuit Noise / Noise Effects in Digital Systems / Noise Effects in Analog Systems / Circuit Design to Minimize Noise Effects / Noise Considerations in SOI.
650 0 _aEngineering.
_99405
650 0 _aElectronic circuits.
_919581
650 0 _aControl engineering.
_931970
650 0 _aRobotics.
_92393
650 0 _aAutomation.
_92392
650 0 _aComputers.
_98172
650 1 4 _aTechnology and Engineering.
_983692
650 2 4 _aElectronic Circuits and Systems.
_983694
650 2 4 _aControl, Robotics, Automation.
_931971
650 2 4 _aComputer Hardware.
_933420
710 2 _aSpringerLink (Online service)
_983695
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031797903
776 0 8 _iPrinted edition:
_z9783031797927
830 0 _aSynthesis Lectures on Digital Circuits & Systems,
_x1932-3174
_983697
856 4 0 _uhttps://doi.org/10.1007/978-3-031-79791-0
912 _aZDB-2-SXSC
942 _cEBK
999 _c85546
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