000 03161nam a22005655i 4500
001 978-3-031-18599-1
003 DE-He213
005 20240730164434.0
007 cr nn 008mamaa
008 221221s2023 sz | s |||| 0|eng d
020 _a9783031185991
_9978-3-031-18599-1
024 7 _a10.1007/978-3-031-18599-1
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aAbich, Geancarlo.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_984500
245 1 0 _aEarly Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices
_h[electronic resource] /
_cby Geancarlo Abich, Luciano Ost, Ricardo Reis.
250 _a1st ed. 2023.
264 1 _aCham :
_bSpringer Nature Switzerland :
_bImprint: Springer,
_c2023.
300 _aXV, 131 p. 47 illus., 44 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSynthesis Lectures on Engineering, Science, and Technology,
_x2690-0327
505 0 _aIntroduction -- Background in ML Models and Radiation Effects -- Related Works -- Soft Error Assessment Methodology -- Early Soft Error Consistency Assessment -- Soft Error Reliability Assessment of ML Inference Models executing on resource-constrained IoT edge devices -- Conclusions and Future Work.
520 _aThis book describes an extensive and consistent soft error assessment of convolutional neural network (CNN) models from different domains through more than 14.8 million fault injections, considering different precision bit-width configurations, optimization parameters, and processor models. The authors also evaluate the relative performance, memory utilization, and soft error reliability trade-offs analysis of different CNN models considering a compiler-based technique w.r.t. traditional redundancy approaches.
650 0 _aElectronic circuits.
_919581
650 0 _aInternet of things.
_94027
650 0 _aElectronic circuit design.
_94185
650 0 _aCooperating objects (Computer systems).
_96195
650 1 4 _aElectronic Circuits and Systems.
_984503
650 2 4 _aInternet of Things.
_94027
650 2 4 _aElectronics Design and Verification.
_938529
650 2 4 _aCyber-Physical Systems.
_932475
700 1 _aOst, Luciano.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_984505
700 1 _aReis, Ricardo.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_984507
710 2 _aSpringerLink (Online service)
_984509
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783031185984
776 0 8 _iPrinted edition:
_z9783031186004
776 0 8 _iPrinted edition:
_z9783031186011
830 0 _aSynthesis Lectures on Engineering, Science, and Technology,
_x2690-0327
_984511
856 4 0 _uhttps://doi.org/10.1007/978-3-031-18599-1
912 _aZDB-2-SXSC
942 _cEBK
999 _c85675
_d85675