Testing for small-delay defects in nanoscale CMOS integrated circuits /
edited by Sandeep K. Goel, Krishnendu Chakrabarty.
- 1 online resource
- Devices, circuits, and systems .
- Devices, circuits, and systems. .
section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.
9781315217819 9781351825016 9781439829424
10.1201/b15549 doi
Metal oxide semiconductors, Complementary--Testing.
TK7871.99.M44 / T43 2014
621.39732 / T344
section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.
9781315217819 9781351825016 9781439829424
10.1201/b15549 doi
Metal oxide semiconductors, Complementary--Testing.
TK7871.99.M44 / T43 2014
621.39732 / T344