Testing for small-delay defects in nanoscale CMOS integrated circuits / (Record no. 71564)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01346cam a2200313Ii 4500 |
| 001 - CONTROL NUMBER | |
| control field | 9781315217819 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 180331s2014 fluad ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781315217819 |
| -- | (e-book : PDF) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781351825016 |
| -- | (e-book: Mobi) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781439829424 |
| -- | (e-book: PDF) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | (hardback) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | (paperback) |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.39732 |
| -- | T344 |
| 245 00 - TITLE STATEMENT | |
| Title | Testing for small-delay defects in nanoscale CMOS integrated circuits / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 online resource |
| 490 1# - SERIES STATEMENT | |
| Series statement | Devices, circuits, and systems |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Testing. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Goel, Sandeep K, |
| 700 1# - AUTHOR 2 | |
| Author 2 | Chakrabarty, Krishnendu, |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://www.taylorfrancis.com/books/9781315217819 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | Boca Raton : |
| -- | CRC Press, |
| -- | 2014. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Metal oxide semiconductors, Complementary |
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