Applications and metrology at nanometer scale. (Record no. 69435)

000 -LEADER
fixed length control field 02114cam a2200481Ia 4500
001 - CONTROL NUMBER
control field on1230218615
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220711203636.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 210111s2021 enk ob 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781119808244
-- (electronic bk. : oBook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1119808243
-- (electronic bk. : oBook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781119808220
-- (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1119808227
-- (electronic bk.)
082 04 - CLASSIFICATION NUMBER
Call Number 389/.1
100 1# - AUTHOR NAME
Author Dahoo, Pierre Richard.
245 10 - TITLE STATEMENT
Title Applications and metrology at nanometer scale.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication London :
Publisher ISTE Ltd. ;
Place of publication Hoboken :
Publisher Wiley
Year of publication 2021.
300 ## - PHYSICAL DESCRIPTION
Number of Pages 1 online resource
490 1# - SERIES STATEMENT
Series statement Mechanical engineering and solid mechanics series
490 1# - SERIES STATEMENT
Series statement Reliability of multiphysical systems set ;
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.
700 1# - AUTHOR 2
Author 2 Pougnet, Philippe.
700 1# - AUTHOR 2
Author 2 El Hami, Abdelkhalak.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://doi.org/10.1002/9781119808244
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Metrology.
650 #7 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Metrology.
-- (OCoLC)fst01018841
994 ## -
-- 92
-- DG1

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