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Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties [electronic resource] / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.

By: Dahoo, Pierre Richard.
Contributor(s): Pougnet, Philippe | El Hami, Abdelkhalak.
Material type: materialTypeLabelBookSeries: Mechanical engineering and solid mechanics series: ; Reliability of multiphysical systems set: v. 9.Publisher: London : Hoboken : ISTE Ltd. ; Wiley 2021Description: 1 online resource.ISBN: 9781119808244; 1119808243; 9781119808220; 1119808227.Subject(s): Metrology | MetrologyGenre/Form: Electronic books.Additional physical formats: Print version:: No titleDDC classification: 389/.1 Online resources: Wiley Online Library
Contents:
Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.
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Nanometer Scale -- Statistical Tools to Reduce the Effect of Design Uncertainties -- Electromagnetic Waves and Their Applications -- Smart Materials -- Propagation of a Light Ray -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics.

Includes bibliographical references and index.

Wiley Frontlist Obook All English 2021

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