Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
By: Dahoo, Pierre Richard [author.]
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Contributor(s): Pougnet, Philippe [author.]
| El Hami, Abdelkhalak [author.]
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Material type: 

Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
Online resource; title from PDF title page (John Wiley, viewed May 7, 2021).
Wiley Frontlist Obook All English 2021
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