Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay.
By: Chattopadhyay, Santanu [author.]
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Contributor(s): Taylor and Francis.
Material type: 
BookPublisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Edition: First edition.Description: 1 online resource (138 pages) : 10 illustrations.ISBN: 9781351227780.Subject(s): Digital integrated circuits -- Testing | Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- Thermal properties | Temperature measurements | TECHNOLOGY & ENGINEERING / Electronics / Circuits / General | TECHNOLOGY & ENGINEERING / Electronics / MicroelectronicsAdditional physical formats: Print version: : No titleDDC classification: 621.39/50287 Online resources: Click here to view. chapter 1 VLSI Testing -- An Introduction / Santanu Chattopadhyay -- chapter 2 Circuit-Level Testing / Santanu Chattopadhyay -- chapter 3 Test-Data Compression / Santanu Chattopadhyay -- chapter 4 System-on-Chip Testing / Santanu Chattopadhyay -- chapter 5 Network-on-Chip Testing / Santanu Chattopadhyay.
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.
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