Central Library

Your search returned 2 results. Subscribe to this search

Unhighlight Highlight
|
Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].

by Strong, Alvin Wayne, 1946- | Wiley [publisher.] | IEEE Xplore (Online Service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2009Online access: Abstract with links to resource Availability: No items available

Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].

by Strong, Alvin Wayne, 1946- | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2009Online access: Abstract with links to resource Availability: No items available